Design and Test of a Complex Mcm Product

A family of high performance, computer oriented multichip module (MCM) products is being developed to provide the building blocks for advanced, high density computer systems. Each MCM is a system level building block that interfaces to other family members through compatible processor and memory busses. By selecting and interconnecting the various MGM blocks, it is possible to configure a variety of high speed, cache coherent, multiprocessing computer designs. The use of multichip modules is necessary to meet system performance and size requirements. This paper focuses on a specific member of the MGM family, a 4M word by 40 bit Dynamic Random Access Memory (DRAM). Special attention is given to product requirements, design methodology, and test strategy. MCM testing is sufficiently complex that test must be an integral part of the complete module design process.