Y. Parfenov, L. Zdoukhov, V. Chepelev, B. Titov, W. Radasky
{"title":"电子设备抗超短电磁脉冲试验用模拟器选择的方法原则","authors":"Y. Parfenov, L. Zdoukhov, V. Chepelev, B. Titov, W. Radasky","doi":"10.1109/APEMC.2016.7523015","DOIUrl":null,"url":null,"abstract":"Shortcomings of the standard ways for tests of electronic devices for immunity to ultrashort electromagnetic pulses (US EMPs) are considered. The method of a choice of simulators being based on use of key parameters of the pulse electric disturbances induced in critical circuits of equipment is offered. This method allows choosing the simulator or some simulators providing the most severe conditions of tests.","PeriodicalId":358257,"journal":{"name":"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"96 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-05-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Methodical principles of a choice of simulators for tests of electronic devices for immunity to ultrashort EMPs\",\"authors\":\"Y. Parfenov, L. Zdoukhov, V. Chepelev, B. Titov, W. Radasky\",\"doi\":\"10.1109/APEMC.2016.7523015\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Shortcomings of the standard ways for tests of electronic devices for immunity to ultrashort electromagnetic pulses (US EMPs) are considered. The method of a choice of simulators being based on use of key parameters of the pulse electric disturbances induced in critical circuits of equipment is offered. This method allows choosing the simulator or some simulators providing the most severe conditions of tests.\",\"PeriodicalId\":358257,\"journal\":{\"name\":\"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)\",\"volume\":\"96 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-05-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APEMC.2016.7523015\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEMC.2016.7523015","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Methodical principles of a choice of simulators for tests of electronic devices for immunity to ultrashort EMPs
Shortcomings of the standard ways for tests of electronic devices for immunity to ultrashort electromagnetic pulses (US EMPs) are considered. The method of a choice of simulators being based on use of key parameters of the pulse electric disturbances induced in critical circuits of equipment is offered. This method allows choosing the simulator or some simulators providing the most severe conditions of tests.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
