基于退化分析的电子元件贮存寿命估计

2018 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2018-09-01 DOI:10.1109/EWDTS.2018.8524786

A. Koulibaba, A. Y. Shtukarev, A. A. Sashoy, O. Yushin

{"title":"基于退化分析的电子元件贮存寿命估计","authors":"A. Koulibaba, A. Y. Shtukarev, A. A. Sashoy, O. Yushin","doi":"10.1109/EWDTS.2018.8524786","DOIUrl":null,"url":null,"abstract":"This article presents one of the ways to use built-in self-test. A method for estimating of storage life of integrated circuits based on predicting the degradation of parameters measured during self-test is proposed.","PeriodicalId":127240,"journal":{"name":"2018 IEEE East-West Design & Test Symposium (EWDTS)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Estimation of Storage Life of Electronic Components Based on Degradation Analysis\",\"authors\":\"A. Koulibaba, A. Y. Shtukarev, A. A. Sashoy, O. Yushin\",\"doi\":\"10.1109/EWDTS.2018.8524786\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article presents one of the ways to use built-in self-test. A method for estimating of storage life of integrated circuits based on predicting the degradation of parameters measured during self-test is proposed.\",\"PeriodicalId\":127240,\"journal\":{\"name\":\"2018 IEEE East-West Design & Test Symposium (EWDTS)\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE East-West Design & Test Symposium (EWDTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EWDTS.2018.8524786\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE East-West Design & Test Symposium (EWDTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EWDTS.2018.8524786","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

本文介绍了一种使用内置自检的方法。提出了一种基于自测参数退化预测的集成电路存储寿命估计方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

Estimation of Storage Life of Electronic Components Based on Degradation Analysis

This article presents one of the ways to use built-in self-test. A method for estimating of storage life of integrated circuits based on predicting the degradation of parameters measured during self-test is proposed.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2018 IEEE East-West Design & Test Symposium (EWDTS)

自引率

0.00%

发文量