基于SOI衬底的单端口A2模AlN Lamb波谐振器

Xianzheng Lu, Hao Ren
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摘要

在本文中,我们提出了一种基于绝缘体上硅(SOI)衬底的二阶非对称(A2)模式的单端口A1N lamb波谐振器。采用重掺杂硅作为底层,采用垂直排列双电极设计补偿有效机电耦合系数($\ mathm {k}_{\ mathm {t}^{2}}$)。采用有限元分析(FEA)对其谐振模式进行了研究。在微细加工和电学表征后,采用Butterworth-van Dyke (BVD)模型拟合测量的导纳曲线以获得谐振性能。表征结果表明,在774MHz谐振频率下,实现了$\mathrm{k}_{\mathrm{t}^{2}}$为0.063%,Q为522.4,相速度超过75000m/s。
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An One-port A2 Mode AlN Lamb Wave Resonator Based on SOI Substrate
In this paper, we propose an one-port A1N lamb wave resonator utilizing the second-order asymmetric (A2) mode based on a silicon-on-insulator (SOI) substrate. Heavily doped silicon is chosen as the bottom layer, while a vertically arranged double-electrodes design is utilized to compensate for the effective electromechanical coupling coefficient ($\mathrm{k}_{\mathrm{t}^{2}}$). Finite element analysis (FEA) is used to investigate the resonance mode. After microfabrication and electrical characterization, the Butterworth-van Dyke (BVD) model is used to fit the measured admittance curve to obtain resonance performance. The characterization results show that a $\mathrm{k}_{\mathrm{t}^{2}}$ of 0.063% and a Q of 522.4 are achieved at a resonant frequency of 774MHz, reporting a high phase velocity exceeding 75000m/s.
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