{"title":"利用经验温束Child-Langmuir模型模拟Ltspice中纳米级真空通道晶体管阵列","authors":"J. Snelling, G. Werner, J. Cary","doi":"10.1109/IVNC57695.2023.10188882","DOIUrl":null,"url":null,"abstract":"Large nanoscale vacuum channel transistor (NVCT) arrays are implemented in LTspice. An empirical warm-beam Child-Langmuir (CL) model is used to determine space charge limiting effects on transmitted current. The LTspice NVCT model is simulated in a Colpitts oscillator circuit. These results are compared to an LTspice NVCT model based on experimental measurements of a particular physical device [1]. The warm-beam CL model is used to demonstrate rapid exploration of different array and circuit parameters.","PeriodicalId":346266,"journal":{"name":"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)","volume":"683 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Simulating Nanoscale Vacuum Channel Transistor Arrays in Ltspice Utilizing an Empirical Warm-Beam Child-Langmuir Model\",\"authors\":\"J. Snelling, G. Werner, J. Cary\",\"doi\":\"10.1109/IVNC57695.2023.10188882\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Large nanoscale vacuum channel transistor (NVCT) arrays are implemented in LTspice. An empirical warm-beam Child-Langmuir (CL) model is used to determine space charge limiting effects on transmitted current. The LTspice NVCT model is simulated in a Colpitts oscillator circuit. These results are compared to an LTspice NVCT model based on experimental measurements of a particular physical device [1]. The warm-beam CL model is used to demonstrate rapid exploration of different array and circuit parameters.\",\"PeriodicalId\":346266,\"journal\":{\"name\":\"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)\",\"volume\":\"683 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-07-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVNC57695.2023.10188882\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVNC57695.2023.10188882","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Simulating Nanoscale Vacuum Channel Transistor Arrays in Ltspice Utilizing an Empirical Warm-Beam Child-Langmuir Model
Large nanoscale vacuum channel transistor (NVCT) arrays are implemented in LTspice. An empirical warm-beam Child-Langmuir (CL) model is used to determine space charge limiting effects on transmitted current. The LTspice NVCT model is simulated in a Colpitts oscillator circuit. These results are compared to an LTspice NVCT model based on experimental measurements of a particular physical device [1]. The warm-beam CL model is used to demonstrate rapid exploration of different array and circuit parameters.
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