一阶和二阶δ - σ转换器的灾难性故障测试

M. H. Amin, M. B. Abdelhalim, H. Amer
{"title":"一阶和二阶δ - σ转换器的灾难性故障测试","authors":"M. H. Amin, M. B. Abdelhalim, H. Amer","doi":"10.1109/ECCTD.2011.6043815","DOIUrl":null,"url":null,"abstract":"Delta-Sigma analog to digital converters are vital components for mixed-signal systems. So, testing this type of converters is extremely important. This paper studies the low-cost testing of first-order and second-order delta-sigma ADCs. Moreover; only catastrophic faults are considered such as open/short passive components and stuck-at faults in digital components. It is proven that the minimal test set consists of only two values that detect all faults in the assumed fault set. The effect of using different types of counters in the digital subcircuit is investigated and it is found that the two-value test set still detects all faults. Finally, the effect of passive component tolerances is analyzed. All the results are analytically proven and verified by simulations.","PeriodicalId":126960,"journal":{"name":"2011 20th European Conference on Circuit Theory and Design (ECCTD)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2011-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Testing of first and second order delta-sigma converters for catastrophic faults\",\"authors\":\"M. H. Amin, M. B. Abdelhalim, H. Amer\",\"doi\":\"10.1109/ECCTD.2011.6043815\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Delta-Sigma analog to digital converters are vital components for mixed-signal systems. So, testing this type of converters is extremely important. This paper studies the low-cost testing of first-order and second-order delta-sigma ADCs. Moreover; only catastrophic faults are considered such as open/short passive components and stuck-at faults in digital components. It is proven that the minimal test set consists of only two values that detect all faults in the assumed fault set. The effect of using different types of counters in the digital subcircuit is investigated and it is found that the two-value test set still detects all faults. Finally, the effect of passive component tolerances is analyzed. All the results are analytically proven and verified by simulations.\",\"PeriodicalId\":126960,\"journal\":{\"name\":\"2011 20th European Conference on Circuit Theory and Design (ECCTD)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-10-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 20th European Conference on Circuit Theory and Design (ECCTD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECCTD.2011.6043815\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 20th European Conference on Circuit Theory and Design (ECCTD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECCTD.2011.6043815","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

Delta-Sigma模数转换器是混合信号系统的重要组成部分。因此,测试这种类型的转换器非常重要。本文研究了一阶和二阶δ - σ adc的低成本测试。此外;在数字器件中,只考虑断路/短路无源器件和卡滞故障等灾难性故障。证明了最小测试集仅由两个值组成,可以检测假定故障集中的所有故障。研究了在数字子电路中使用不同类型计数器的效果,发现双值测试集仍然可以检测到所有故障。最后,分析了被动元件公差的影响。所有结果都经过了分析验证和仿真验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Testing of first and second order delta-sigma converters for catastrophic faults
Delta-Sigma analog to digital converters are vital components for mixed-signal systems. So, testing this type of converters is extremely important. This paper studies the low-cost testing of first-order and second-order delta-sigma ADCs. Moreover; only catastrophic faults are considered such as open/short passive components and stuck-at faults in digital components. It is proven that the minimal test set consists of only two values that detect all faults in the assumed fault set. The effect of using different types of counters in the digital subcircuit is investigated and it is found that the two-value test set still detects all faults. Finally, the effect of passive component tolerances is analyzed. All the results are analytically proven and verified by simulations.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Decade bandwidth single and cascaded travelling wave medium power amplifiers using sige hbts Hilbert transform by divide-and-conquer piecewise linear approximation Analysis and design of an array of two differential oscillators coupled through a resistive network Impact of NMOS/PMOS imbalance in Ultra-Low Voltage CMOS standard cells Utilization of distortion contribution analysis
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1