使用屏蔽Rogowski线圈测量由于带电电路板事件而通过IC的放电电流

2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) Pub Date : 2016-09-01 DOI:10.1109/EOSESD.2016.7592537

Junsik Park, Jong-Sung Lee, Seongmoo Kim, Cheolgu Jo, Byongsu Seol, Jingook Kim

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引用次数: 2

摘要

使用屏蔽Rogowski线圈测量由带电板事件(CBE)引起的通过IC的放电电流。在测量中采用了几种屏蔽技术来降低共模噪声和意外电场耦合。通过CBE电路仿真验证了测量结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Measurement of discharging currents through an IC due to the charged board event using a shielded Rogowski coil

The discharging currents through an IC induced by the charged board event (CBE) is measured using a shielded Rogowski coil. Several shielding techniques are applied in the measurement to reduce the common mode noise and the unexpected electric field coupling. The measured results are validated with the CBE circuit simulations.

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2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

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