{"title":"使用电子束随机存取读写数字测试信号","authors":"J. Jensen, K. Martin","doi":"10.1109/ISSCC.1984.1156632","DOIUrl":null,"url":null,"abstract":"An E-beam that was used both to inject and read digital signals for diagnostic test of NMOS and CMOS ICs will be discussed. E-beam programmable master-slave flip-flops, which add less than 0.25pF circuit load, were included for signal injection purposes.","PeriodicalId":260117,"journal":{"name":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"156 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Use of E-beam for random access read and write of digital test signals\",\"authors\":\"J. Jensen, K. Martin\",\"doi\":\"10.1109/ISSCC.1984.1156632\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An E-beam that was used both to inject and read digital signals for diagnostic test of NMOS and CMOS ICs will be discussed. E-beam programmable master-slave flip-flops, which add less than 0.25pF circuit load, were included for signal injection purposes.\",\"PeriodicalId\":260117,\"journal\":{\"name\":\"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"volume\":\"156 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.1984.1156632\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1984.1156632","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Use of E-beam for random access read and write of digital test signals
An E-beam that was used both to inject and read digital signals for diagnostic test of NMOS and CMOS ICs will be discussed. E-beam programmable master-slave flip-flops, which add less than 0.25pF circuit load, were included for signal injection purposes.
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