码字子集的评估以保证检查器的自测试性

N. Butorina, Y. Burkatovskaya, E. Pakhomova
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引用次数: 0

摘要

考虑了基于clb的自检(m, n)码检查器设计方法。clb应该在lut技术的框架下进行。在设计检查器时,采用了特殊的展开公式。检查器故障集V包括在CLB输入端发生的所有多个卡在故障。出现在检查器输入端的码字数l可以小于所有可能的码字数。这意味着连接到自检电路输出端的自检检查器的某些故障是无法检测到的。本文建立了码字子集的一个属性,它允许我们检查给定子集是否提供了检查器的自测试属性。在开发的算法中使用该属性来分析码字子集。
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Evaluation of Code-Word Subsets to Ensure the Self-Testing Property of a Checker
The method of a self-testing (m, n)-code checker design based on the use of CLBs is considered. CLBs are supposed to be carried out in the framework of LUT-technology. To design the checker, a special expansion formula is used. The set V of checker faults includes all multiple stuck-at faults occurred at CLB inputs. The number l of code words appearing at the inputs of the checker can be less than the number of all possible code words. It implies that some faults of the self-testing checker connected to the outputs of the self-checking circuit can be undetectable. The paper establishes a property of a subset of code words, which allows us to check if a given subset provides the self-testing property of the checker. The property is used in the developed algorithm for analyzing a subset of code words.
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