使用算法调试的高级设计验证

J. Naganuma, T. Ogura, T. Hoshino
{"title":"使用算法调试的高级设计验证","authors":"J. Naganuma, T. Ogura, T. Hoshino","doi":"10.1109/EDTC.1994.326833","DOIUrl":null,"url":null,"abstract":"This paper proposes a new environment for high-level LSI design validation using \"Algorithmic Debugging\" and evaluates its benefits on three significant examples. A design is specified at a high-level using the structured analysis (SA) method and some errors included in SA specifications are efficiently located by answering just a few queries from the debugger. The number of interactions between the designer and the debugger is reduced by a factor of ten to a hundred compared to conventional simulation based validation methodologies. This environment promises to be an important step towards efficient high-level LSI design validation.<<ETX>>","PeriodicalId":244297,"journal":{"name":"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC","volume":"2676 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-02-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"High-level design validation using algorithmic debugging\",\"authors\":\"J. Naganuma, T. Ogura, T. Hoshino\",\"doi\":\"10.1109/EDTC.1994.326833\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes a new environment for high-level LSI design validation using \\\"Algorithmic Debugging\\\" and evaluates its benefits on three significant examples. A design is specified at a high-level using the structured analysis (SA) method and some errors included in SA specifications are efficiently located by answering just a few queries from the debugger. The number of interactions between the designer and the debugger is reduced by a factor of ten to a hundred compared to conventional simulation based validation methodologies. This environment promises to be an important step towards efficient high-level LSI design validation.<<ETX>>\",\"PeriodicalId\":244297,\"journal\":{\"name\":\"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC\",\"volume\":\"2676 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-02-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDTC.1994.326833\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDTC.1994.326833","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

本文提出了一种使用“算法调试”进行高级LSI设计验证的新环境,并通过三个重要实例对其效益进行了评估。使用结构化分析(SA)方法在高层指定设计,通过回答调试器的几个查询,可以有效地定位SA规范中包含的一些错误。与传统的基于仿真的验证方法相比,设计器和调试器之间的交互次数减少了十倍到一百倍。这种环境有望成为迈向高效高级LSI设计验证的重要一步。
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High-level design validation using algorithmic debugging
This paper proposes a new environment for high-level LSI design validation using "Algorithmic Debugging" and evaluates its benefits on three significant examples. A design is specified at a high-level using the structured analysis (SA) method and some errors included in SA specifications are efficiently located by answering just a few queries from the debugger. The number of interactions between the designer and the debugger is reduced by a factor of ten to a hundred compared to conventional simulation based validation methodologies. This environment promises to be an important step towards efficient high-level LSI design validation.<>
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