Aibin Yan, Yan Chen, Jun Zhou, Jie Cui, Tianming Ni, X. Wen, P. Girard
{"title":"防止双节点干扰的六元交叉耦合SRAM单元","authors":"Aibin Yan, Yan Chen, Jun Zhou, Jie Cui, Tianming Ni, X. Wen, P. Girard","doi":"10.1109/ATS49688.2020.9301569","DOIUrl":null,"url":null,"abstract":"In this paper, we propose a sextuple cross-coupled SRAM cell, namely SCCS18T, protected against double-node upsets. Since the proposed SCCS18T cell forms a large feedback loop for value retention and error interception, the cell can provide self-recoverability from any single-node upsets (SNUs) and partial double-node upsets (DNUs). Moreover, the proposed cell has optimized operation speed due to the use of six access transistors. Simulation results show that the SCCS18T cell can save approximately 65% read access time at the cost of 49% power dissipation and 50% silicon area on average, compared with typical hardened SRAM cells.","PeriodicalId":220508,"journal":{"name":"2020 IEEE 29th Asian Test Symposium (ATS)","volume":"229 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets\",\"authors\":\"Aibin Yan, Yan Chen, Jun Zhou, Jie Cui, Tianming Ni, X. Wen, P. Girard\",\"doi\":\"10.1109/ATS49688.2020.9301569\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we propose a sextuple cross-coupled SRAM cell, namely SCCS18T, protected against double-node upsets. Since the proposed SCCS18T cell forms a large feedback loop for value retention and error interception, the cell can provide self-recoverability from any single-node upsets (SNUs) and partial double-node upsets (DNUs). Moreover, the proposed cell has optimized operation speed due to the use of six access transistors. Simulation results show that the SCCS18T cell can save approximately 65% read access time at the cost of 49% power dissipation and 50% silicon area on average, compared with typical hardened SRAM cells.\",\"PeriodicalId\":220508,\"journal\":{\"name\":\"2020 IEEE 29th Asian Test Symposium (ATS)\",\"volume\":\"229 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-11-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE 29th Asian Test Symposium (ATS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS49688.2020.9301569\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 29th Asian Test Symposium (ATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS49688.2020.9301569","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets
In this paper, we propose a sextuple cross-coupled SRAM cell, namely SCCS18T, protected against double-node upsets. Since the proposed SCCS18T cell forms a large feedback loop for value retention and error interception, the cell can provide self-recoverability from any single-node upsets (SNUs) and partial double-node upsets (DNUs). Moreover, the proposed cell has optimized operation speed due to the use of six access transistors. Simulation results show that the SCCS18T cell can save approximately 65% read access time at the cost of 49% power dissipation and 50% silicon area on average, compared with typical hardened SRAM cells.