{"title":"一种多类集分类的特征选择方法","authors":"Bin Yu, Baozong Yuan","doi":"10.1109/IJCNN.1992.227114","DOIUrl":null,"url":null,"abstract":"A versatile technique for set-feature selection from class features without any prior knowledge for multi-class-set classification is presented. A class set is a group of classes in which the patterns represented with class features can be classified with a existing classifier. The features used to classify patterns between classes within a class set are referred to as class features and the ones used to classify patterns between class sets as set features. A set-feature set is produced from class-feature sets under the criterion of minimizing the encounter zones between class sets in set-feature space. The performance of this technique was illustrated with an experiment on the understanding of circuit diagrams.<<ETX>>","PeriodicalId":286849,"journal":{"name":"[Proceedings 1992] IJCNN International Joint Conference on Neural Networks","volume":"53 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A feature selection method for multi-class-set classification\",\"authors\":\"Bin Yu, Baozong Yuan\",\"doi\":\"10.1109/IJCNN.1992.227114\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A versatile technique for set-feature selection from class features without any prior knowledge for multi-class-set classification is presented. A class set is a group of classes in which the patterns represented with class features can be classified with a existing classifier. The features used to classify patterns between classes within a class set are referred to as class features and the ones used to classify patterns between class sets as set features. A set-feature set is produced from class-feature sets under the criterion of minimizing the encounter zones between class sets in set-feature space. The performance of this technique was illustrated with an experiment on the understanding of circuit diagrams.<<ETX>>\",\"PeriodicalId\":286849,\"journal\":{\"name\":\"[Proceedings 1992] IJCNN International Joint Conference on Neural Networks\",\"volume\":\"53 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-06-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[Proceedings 1992] IJCNN International Joint Conference on Neural Networks\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IJCNN.1992.227114\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[Proceedings 1992] IJCNN International Joint Conference on Neural Networks","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IJCNN.1992.227114","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A feature selection method for multi-class-set classification
A versatile technique for set-feature selection from class features without any prior knowledge for multi-class-set classification is presented. A class set is a group of classes in which the patterns represented with class features can be classified with a existing classifier. The features used to classify patterns between classes within a class set are referred to as class features and the ones used to classify patterns between class sets as set features. A set-feature set is produced from class-feature sets under the criterion of minimizing the encounter zones between class sets in set-feature space. The performance of this technique was illustrated with an experiment on the understanding of circuit diagrams.<>