{"title":"LED驱动器用铝电解电容器的退化模型","authors":"Bo Sun, Xuejun Fan, C. Yuan, C. Qian, Guoqi Zhang","doi":"10.1109/EUROSIME.2015.7103124","DOIUrl":null,"url":null,"abstract":"The failure of aluminum electrolytic capacitors is considered as one of major failure modes of the LED drivers. This paper propose a degradation model of aluminum electrolytic capacitors considers impacts of operation time and temperature.","PeriodicalId":250897,"journal":{"name":"2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","volume":"261 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-04-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"A degradation model of aluminum electrolytic capacitors for LED drivers\",\"authors\":\"Bo Sun, Xuejun Fan, C. Yuan, C. Qian, Guoqi Zhang\",\"doi\":\"10.1109/EUROSIME.2015.7103124\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The failure of aluminum electrolytic capacitors is considered as one of major failure modes of the LED drivers. This paper propose a degradation model of aluminum electrolytic capacitors considers impacts of operation time and temperature.\",\"PeriodicalId\":250897,\"journal\":{\"name\":\"2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems\",\"volume\":\"261 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-04-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EUROSIME.2015.7103124\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUROSIME.2015.7103124","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A degradation model of aluminum electrolytic capacitors for LED drivers
The failure of aluminum electrolytic capacitors is considered as one of major failure modes of the LED drivers. This paper propose a degradation model of aluminum electrolytic capacitors considers impacts of operation time and temperature.