{"title":"红外线和太赫兹纳米显微镜","authors":"R. Hillenbrand","doi":"10.1109/PHOSST.2010.5553706","DOIUrl":null,"url":null,"abstract":"We demonstrate nanoscale resolved IR and THz imaging by recording the elastically scattered light from the laser-illuminated tip of an atomic force microscope tip. Applications such as electronic and photonic device characterization will be presented.","PeriodicalId":440419,"journal":{"name":"IEEE Photonics Society Summer Topicals 2010","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-07-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Infrared and terahertz nanoscopy\",\"authors\":\"R. Hillenbrand\",\"doi\":\"10.1109/PHOSST.2010.5553706\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We demonstrate nanoscale resolved IR and THz imaging by recording the elastically scattered light from the laser-illuminated tip of an atomic force microscope tip. Applications such as electronic and photonic device characterization will be presented.\",\"PeriodicalId\":440419,\"journal\":{\"name\":\"IEEE Photonics Society Summer Topicals 2010\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-07-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Photonics Society Summer Topicals 2010\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PHOSST.2010.5553706\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Photonics Society Summer Topicals 2010","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PHOSST.2010.5553706","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
We demonstrate nanoscale resolved IR and THz imaging by recording the elastically scattered light from the laser-illuminated tip of an atomic force microscope tip. Applications such as electronic and photonic device characterization will be presented.
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