一种新的内存协议标准功能验证方法

Omar Samir, Moustafa Kassem, Mohammed Sameh, Sarah Aly, M. Rizk, Mohamed Abdelsalam, A. Salem
{"title":"一种新的内存协议标准功能验证方法","authors":"Omar Samir, Moustafa Kassem, Mohammed Sameh, Sarah Aly, M. Rizk, Mohamed Abdelsalam, A. Salem","doi":"10.1109/IDT.2013.6727111","DOIUrl":null,"url":null,"abstract":"This paper aims to develop an Open Verification Methodology (OVM) environment to support testing of memory protocol standards and verify their operation using coverage driven verification (CDV) and constrained random testing (CRT). The objective is to achieve most of the verification plan goals with less time and effort and to create reusable verification environment components. We demonstrate the robustness of this approach using LPDDR3 memory protocol as a case study.","PeriodicalId":446826,"journal":{"name":"2013 8th IEEE Design and Test Symposium","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A novel approach for functional verification of memory protocol standard\",\"authors\":\"Omar Samir, Moustafa Kassem, Mohammed Sameh, Sarah Aly, M. Rizk, Mohamed Abdelsalam, A. Salem\",\"doi\":\"10.1109/IDT.2013.6727111\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper aims to develop an Open Verification Methodology (OVM) environment to support testing of memory protocol standards and verify their operation using coverage driven verification (CDV) and constrained random testing (CRT). The objective is to achieve most of the verification plan goals with less time and effort and to create reusable verification environment components. We demonstrate the robustness of this approach using LPDDR3 memory protocol as a case study.\",\"PeriodicalId\":446826,\"journal\":{\"name\":\"2013 8th IEEE Design and Test Symposium\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 8th IEEE Design and Test Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IDT.2013.6727111\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 8th IEEE Design and Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IDT.2013.6727111","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文旨在开发一个开放验证方法(OVM)环境,以支持内存协议标准的测试,并使用覆盖驱动验证(CDV)和约束随机测试(CRT)验证其操作。目标是用更少的时间和精力实现大多数验证计划目标,并创建可重用的验证环境组件。我们使用LPDDR3内存协议作为案例研究来证明这种方法的鲁棒性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
A novel approach for functional verification of memory protocol standard
This paper aims to develop an Open Verification Methodology (OVM) environment to support testing of memory protocol standards and verify their operation using coverage driven verification (CDV) and constrained random testing (CRT). The objective is to achieve most of the verification plan goals with less time and effort and to create reusable verification environment components. We demonstrate the robustness of this approach using LPDDR3 memory protocol as a case study.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Assertion based on-line fault detection applied on UHF RFID tag Evaluation of the angle of arrival based techniques Novel designs of digital detection analyzer for intelligent detection and analysis in digital microfluidic biochips Systolic architecture for hardware implementation of two-dimensional non-separable filter-bank Compilation optimization exploration for thermal dissipation reduction in embedded systems
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1