4gbps高密度交流耦合互连

S. Mick, John M. Wilson, P. Franzon
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引用次数: 88

摘要

交流耦合互连使集成电路之间的通信数据速率达到每秒千兆位,具有非常高的引脚数和低功耗。交流耦合可以通过串联电容或电感耦合元件来实现。当需要低功率I/O缓冲器时,当每个IC的顶层金属中有足够的面积专用于耦合电容器时,电容式交流耦合提供更好的性能。在电路复杂性的轻微代价下,电感式交流耦合可用于将I/O垫间距降低到75 /spl mu/m并保持可控的阻抗连接。一种新颖的物理结构,埋入式焊点,作为一种解决方案,用于在与交流连接相同的表面上提供直流电源和接地连接。当与nrz容忍接收器和电流模式信号一起使用时,可以建立高效的互连结构。除了展示这项工作的物理和电路方面外,还展示了实验结果。
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4 Gbps high-density AC coupled interconnection
AC coupled interconnects enable multi-gigabit-persecond communication data rates between integrated circuits with very high pin counts and low power consumption. AC coupling can be realized with either series capacitive or inductive coupling elements. Capacitive AC coupling offers better performance when low power I/O buffers are required and when there is sufficient area to dedicate to coupling capacitors in the top-level metal of each IC. At a slight expense of circuit complexity, inductive AC coupling can be used to bring I/O pad pitches down to 75 /spl mu/m and maintain a controlled impedance connection. A novel physical structure, buried solder bumps, are used as a solution for providing DC power and ground connections across the same surface as the AC connections. When used in conjunction with NRZ-tolerant receivers, and current-mode signaling, highly effective interconnect structures can be built. As well as presenting both physical and circuit aspects of this work, experimental results are shown.
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