具有扩展共模能力的LVDS驱动和接收ic的TID测试结果

2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2019-09-01 DOI:10.1109/radecs47380.2019.9745709

Y. Tcherniavskaya, V. Burkhay, A. Rocke, V. Shunkov, F. Gerfers

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引用次数: 1

摘要

本报告提供了LVDS驱动器和接收器的TID鲁棒性测试结果。达到了56克拉(Si)的硬度，具有完整的性能。在一定的限制下，电路可以工作到100克拉(Si)。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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TID Test Results of LVDS Driver and Receiver ICs with Extended Common Mode Capability

This report provides results of TID robustness tests of LVDS driver and receiver. 56 krad (Si) hardness with full performance has been achieved. With certain limitations circuits are working up to 100 krad (Si).

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2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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