S. Schuster, B. Chappell, V. DiLionardo, P. Britton
{"title":"一个20ns 64K NMOS内存","authors":"S. Schuster, B. Chappell, V. DiLionardo, P. Britton","doi":"10.1109/ISSCC.1984.1156718","DOIUrl":null,"url":null,"abstract":"A 32.6mm24K×16 NMOS SRAM having a 20ns access time and 30ns cycle time will be covered. The SRAM utilizes a 4 transistor dynamic refresh memory cell with 1.7μm features and single level polycide.","PeriodicalId":260117,"journal":{"name":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"A 20ns 64K NMOS RAM\",\"authors\":\"S. Schuster, B. Chappell, V. DiLionardo, P. Britton\",\"doi\":\"10.1109/ISSCC.1984.1156718\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A 32.6mm24K×16 NMOS SRAM having a 20ns access time and 30ns cycle time will be covered. The SRAM utilizes a 4 transistor dynamic refresh memory cell with 1.7μm features and single level polycide.\",\"PeriodicalId\":260117,\"journal\":{\"name\":\"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.1984.1156718\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1984.1156718","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 32.6mm24K×16 NMOS SRAM having a 20ns access time and 30ns cycle time will be covered. The SRAM utilizes a 4 transistor dynamic refresh memory cell with 1.7μm features and single level polycide.