基于卷积稀疏编码的光场显微镜定位估计

Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP) Pub Date : 2019-06-24 DOI:10.1364/MATH.2019.MM2D.2

P. Song, H. V. Jadan, Peter Quicke, Carmel L. Howe, Amanda J. Foust, P. Dragotti

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引用次数: 1

摘要

在这项工作中，我们提出了一种利用极平面图像(EPIs)的稀疏性和卷积稀疏编码从光场显微镜数据中估计物体深度位置的算法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Location Estimation for Light Field Microscopy based on Convolutional Sparse Coding

In this work, we propose an algorithm to estimate the depth location of objects from lightfield microscopy data by leveraging the sparsity of Epipolar Plane Images (EPIs) and convolutional sparse coding.

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Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP)

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