{"title":"488×430线间传输CCD成像仪，集成了曝光和盛开控制","authors":"T. Chan, O. Barrett, C. Chen, Y. Abendini, D. Wen","doi":"10.1109/ISSCC.1984.1156624","DOIUrl":null,"url":null,"abstract":"A 488-element NTSC-compatible CCD imager with a 2/3\" format device utilizing a differentially-diffused drain for variable exposure control and element antiblooming will be coverecL","PeriodicalId":260117,"journal":{"name":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"A 488×430 interline transfer CCD imager with integrated exposure and blooming control\",\"authors\":\"T. Chan, O. Barrett, C. Chen, Y. Abendini, D. Wen\",\"doi\":\"10.1109/ISSCC.1984.1156624\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A 488-element NTSC-compatible CCD imager with a 2/3\\\" format device utilizing a differentially-diffused drain for variable exposure control and element antiblooming will be coverecL\",\"PeriodicalId\":260117,\"journal\":{\"name\":\"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.1984.1156624\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1984.1156624","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 488×430 interline transfer CCD imager with integrated exposure and blooming control
A 488-element NTSC-compatible CCD imager with a 2/3" format device utilizing a differentially-diffused drain for variable exposure control and element antiblooming will be coverecL
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