{"title":"华氏温度传感器","authors":"R. Pease","doi":"10.1109/ISSCC.1984.1156619","DOIUrl":null,"url":null,"abstract":"A monolithic IC whose output is linearly proporational to Fahrenheit temparature will be discussed. The circuit develops +10.0mV/°F and is accurate<tex>±1/2°</tex>F from -50° to +300°F. Accuracy is achieved by wafer level trimming at room temparature.","PeriodicalId":260117,"journal":{"name":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"252 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A fahrenheit temperature sensor\",\"authors\":\"R. Pease\",\"doi\":\"10.1109/ISSCC.1984.1156619\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A monolithic IC whose output is linearly proporational to Fahrenheit temparature will be discussed. The circuit develops +10.0mV/°F and is accurate<tex>±1/2°</tex>F from -50° to +300°F. Accuracy is achieved by wafer level trimming at room temparature.\",\"PeriodicalId\":260117,\"journal\":{\"name\":\"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"volume\":\"252 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.1984.1156619\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1984.1156619","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A monolithic IC whose output is linearly proporational to Fahrenheit temparature will be discussed. The circuit develops +10.0mV/°F and is accurate±1/2°F from -50° to +300°F. Accuracy is achieved by wafer level trimming at room temparature.
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