{"title":"介质击穿对TMR传感器的影响及焦耳加热的作用","authors":"I. Eric, T. Iben","doi":"10.1109/EOSESD.2016.7592529","DOIUrl":null,"url":null,"abstract":"For voltage (V) stress of TMRs, the log of the dielectric breakdown time is found to be linear in (H-γZaV/t<sub>B</sub>)/(k<sub>B</sub>T), where H, γ, Z, a, t<sub>B</sub> and k<sub>B</sub> are an activation energy, a parameter, charge, tunnel barrier lattice constant and thickness, and Boltzmann constant. T is the ambient plus Joule heating temperature of the tunnel barrier.","PeriodicalId":239756,"journal":{"name":"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","volume":"388 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Dielectric breakdown of TMR sensors and the role of Joule heating\",\"authors\":\"I. Eric, T. Iben\",\"doi\":\"10.1109/EOSESD.2016.7592529\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"For voltage (V) stress of TMRs, the log of the dielectric breakdown time is found to be linear in (H-γZaV/t<sub>B</sub>)/(k<sub>B</sub>T), where H, γ, Z, a, t<sub>B</sub> and k<sub>B</sub> are an activation energy, a parameter, charge, tunnel barrier lattice constant and thickness, and Boltzmann constant. T is the ambient plus Joule heating temperature of the tunnel barrier.\",\"PeriodicalId\":239756,\"journal\":{\"name\":\"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)\",\"volume\":\"388 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EOSESD.2016.7592529\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EOSESD.2016.7592529","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Dielectric breakdown of TMR sensors and the role of Joule heating
For voltage (V) stress of TMRs, the log of the dielectric breakdown time is found to be linear in (H-γZaV/tB)/(kBT), where H, γ, Z, a, tB and kB are an activation energy, a parameter, charge, tunnel barrier lattice constant and thickness, and Boltzmann constant. T is the ambient plus Joule heating temperature of the tunnel barrier.