{"title":"用于ALU验证的输入和输出生成:一个用例","authors":"Ondrej Cekan, R. Panek, Z. Kotásek","doi":"10.1109/EWDTS.2018.8524641","DOIUrl":null,"url":null,"abstract":"The paper presents the approach to universal stimuli generation for an arithmetic-logic unit (ALU). It is not focused only on input data generation, but it is possible to generate also expected output in one stimulus. The process of generation is based on a probabilistic constrained grammar which is designed to universally describe stimuli for various circuits. This grammar is processed by our framework. The experiment in functional verification, which shows the quality of generated stimuli, is also presented.","PeriodicalId":127240,"journal":{"name":"2018 IEEE East-West Design & Test Symposium (EWDTS)","volume":"266 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Input and Output Generation for the Verification of ALU: A Use Case\",\"authors\":\"Ondrej Cekan, R. Panek, Z. Kotásek\",\"doi\":\"10.1109/EWDTS.2018.8524641\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper presents the approach to universal stimuli generation for an arithmetic-logic unit (ALU). It is not focused only on input data generation, but it is possible to generate also expected output in one stimulus. The process of generation is based on a probabilistic constrained grammar which is designed to universally describe stimuli for various circuits. This grammar is processed by our framework. The experiment in functional verification, which shows the quality of generated stimuli, is also presented.\",\"PeriodicalId\":127240,\"journal\":{\"name\":\"2018 IEEE East-West Design & Test Symposium (EWDTS)\",\"volume\":\"266 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE East-West Design & Test Symposium (EWDTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EWDTS.2018.8524641\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE East-West Design & Test Symposium (EWDTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EWDTS.2018.8524641","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Input and Output Generation for the Verification of ALU: A Use Case
The paper presents the approach to universal stimuli generation for an arithmetic-logic unit (ALU). It is not focused only on input data generation, but it is possible to generate also expected output in one stimulus. The process of generation is based on a probabilistic constrained grammar which is designed to universally describe stimuli for various circuits. This grammar is processed by our framework. The experiment in functional verification, which shows the quality of generated stimuli, is also presented.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
