{"title":"针对不同样品上平行划痕的仪器边缘起伏组合估计问题","authors":"K. Novikov","doi":"10.1109/EDM.2009.5173961","DOIUrl":null,"url":null,"abstract":"The heuristic algorithm of combination the estimations of the instrument edge relief in the view of parallel scratches on different samples is considered in this paper. The practical comparison of this algorithm with algorithms presented in [1], [2], [3] is given. It is shown, that the aim of algorithms [1], [2], [3] which is the searching of comparison the 1D signals from sites maximally identical by the form can lead to incorrect functioning the given algorithms. The algorithm offered in given paper is essentially free from this lack.","PeriodicalId":262499,"journal":{"name":"2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The problem of combination the estimations of the instrument edge relief in the view of parallel scratches on different samples\",\"authors\":\"K. Novikov\",\"doi\":\"10.1109/EDM.2009.5173961\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The heuristic algorithm of combination the estimations of the instrument edge relief in the view of parallel scratches on different samples is considered in this paper. The practical comparison of this algorithm with algorithms presented in [1], [2], [3] is given. It is shown, that the aim of algorithms [1], [2], [3] which is the searching of comparison the 1D signals from sites maximally identical by the form can lead to incorrect functioning the given algorithms. The algorithm offered in given paper is essentially free from this lack.\",\"PeriodicalId\":262499,\"journal\":{\"name\":\"2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices\",\"volume\":\"33 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDM.2009.5173961\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDM.2009.5173961","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The problem of combination the estimations of the instrument edge relief in the view of parallel scratches on different samples
The heuristic algorithm of combination the estimations of the instrument edge relief in the view of parallel scratches on different samples is considered in this paper. The practical comparison of this algorithm with algorithms presented in [1], [2], [3] is given. It is shown, that the aim of algorithms [1], [2], [3] which is the searching of comparison the 1D signals from sites maximally identical by the form can lead to incorrect functioning the given algorithms. The algorithm offered in given paper is essentially free from this lack.