针对不同样品上平行划痕的仪器边缘起伏组合估计问题

K. Novikov
{"title":"针对不同样品上平行划痕的仪器边缘起伏组合估计问题","authors":"K. Novikov","doi":"10.1109/EDM.2009.5173961","DOIUrl":null,"url":null,"abstract":"The heuristic algorithm of combination the estimations of the instrument edge relief in the view of parallel scratches on different samples is considered in this paper. The practical comparison of this algorithm with algorithms presented in [1], [2], [3] is given. It is shown, that the aim of algorithms [1], [2], [3] which is the searching of comparison the 1D signals from sites maximally identical by the form can lead to incorrect functioning the given algorithms. The algorithm offered in given paper is essentially free from this lack.","PeriodicalId":262499,"journal":{"name":"2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The problem of combination the estimations of the instrument edge relief in the view of parallel scratches on different samples\",\"authors\":\"K. Novikov\",\"doi\":\"10.1109/EDM.2009.5173961\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The heuristic algorithm of combination the estimations of the instrument edge relief in the view of parallel scratches on different samples is considered in this paper. The practical comparison of this algorithm with algorithms presented in [1], [2], [3] is given. It is shown, that the aim of algorithms [1], [2], [3] which is the searching of comparison the 1D signals from sites maximally identical by the form can lead to incorrect functioning the given algorithms. The algorithm offered in given paper is essentially free from this lack.\",\"PeriodicalId\":262499,\"journal\":{\"name\":\"2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices\",\"volume\":\"33 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDM.2009.5173961\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDM.2009.5173961","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文研究了一种结合不同样本上平行划痕的仪器边缘起伏估计的启发式算法。并将该算法与[1]、[2]、[3]中提出的算法进行了实际比较。结果表明,算法[1],[2],[3]的目的是搜索比较来自形式最大相同的站点的1D信号,这可能导致给定算法的不正确功能。给定论文中提供的算法基本上没有这种缺陷。
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The problem of combination the estimations of the instrument edge relief in the view of parallel scratches on different samples
The heuristic algorithm of combination the estimations of the instrument edge relief in the view of parallel scratches on different samples is considered in this paper. The practical comparison of this algorithm with algorithms presented in [1], [2], [3] is given. It is shown, that the aim of algorithms [1], [2], [3] which is the searching of comparison the 1D signals from sites maximally identical by the form can lead to incorrect functioning the given algorithms. The algorithm offered in given paper is essentially free from this lack.
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