{"title":"YATE故障安全界面:用户的观点","authors":"D. Bied-Charreton, D. Guillon, B. Jacques","doi":"10.1109/MTDT.2002.1029761","DOIUrl":null,"url":null,"abstract":"This paper deals with some aspects of the use of self-checking integrated circuits in an application that manages the major risks involved in a transport system. It aims to provide an objective account of the advantages and disadvantages of this type of technology. Attention has been focused on the demands made by such integrated circuits on their environment, in particular the CPUs which control them. Nevertheless, much work still needs to be done to bring the design and testing of integrated circuits more in line with the needs of rail safety applications.","PeriodicalId":230758,"journal":{"name":"Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002)","volume":"147 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The YATE fail-safe interface: the user's point of view\",\"authors\":\"D. Bied-Charreton, D. Guillon, B. Jacques\",\"doi\":\"10.1109/MTDT.2002.1029761\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper deals with some aspects of the use of self-checking integrated circuits in an application that manages the major risks involved in a transport system. It aims to provide an objective account of the advantages and disadvantages of this type of technology. Attention has been focused on the demands made by such integrated circuits on their environment, in particular the CPUs which control them. Nevertheless, much work still needs to be done to bring the design and testing of integrated circuits more in line with the needs of rail safety applications.\",\"PeriodicalId\":230758,\"journal\":{\"name\":\"Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002)\",\"volume\":\"147 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-07-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MTDT.2002.1029761\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MTDT.2002.1029761","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The YATE fail-safe interface: the user's point of view
This paper deals with some aspects of the use of self-checking integrated circuits in an application that manages the major risks involved in a transport system. It aims to provide an objective account of the advantages and disadvantages of this type of technology. Attention has been focused on the demands made by such integrated circuits on their environment, in particular the CPUs which control them. Nevertheless, much work still needs to be done to bring the design and testing of integrated circuits more in line with the needs of rail safety applications.