光敏苯并环丁烯MCM-D技术的发展

C. B. Adamo, A. Flacker, Hercílio M. Cavalcanti, R. C. Teixeira, A. Rotondaro, L. Manera
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引用次数: 3

摘要

本文评价了利用光敏苯并环丁烯(BCB)制备无源器件的多芯片模块沉积(MCM-D)技术的发展。该聚合物作为介质,Ni-P/Au作为导电膜。电阻片电阻的测量采用TLM法和直接测量法,而电容和电感的测量则需要使用矢量网络分析仪(VNA),并对得到的s参数矩阵进行处理,以提取电容和电感的值。
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Development of MCM-D technology with photosensitive benzocyclobutene
This paper evaluates the development of Multi-Chip Module Deposited (MCM-D) technology using photosensitive benzocyclobutene (BCB) to produce passive devices. The polymer was used as the dielectric and Ni-P/Au was used as the conductor film. The resistors' sheet resistance was measured with both TLM and direct measurement while the measurements of the capacitors and inductors required the usage of a Vector Network Analyzer (VNA) and treatment of the obtained s-parameters matrix in order to extract the values of both the capacitances and inductances.
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