{"title":"采用Sn-Pb-La焊料合金的高可靠焊点","authors":"X. Ma, Y. Qian, F. Liu, F. Yoshida","doi":"10.1109/IPFA.2001.941456","DOIUrl":null,"url":null,"abstract":"Reliability of solder joints is essential to electronic packaging since they provide both the mechanical and electrical connections at PCB level assembly. Several efforts have been made to improve the mechanical properties of traditional Sn60-Pb40 solder alloys by adding small amounts of alloy elements, such as Ag, Sb, Cu, Pd, etc. (Vaynman et al., 1998; Takemoto et al., 1997; Devore, 1982). Although the provided experimental data illustrated the effect of improvements, the corresponding modification mechanism had been little discussed. In this work, a small amount of rare earth element La was added to Sn60-Pb40 solder in order to improve the reliability of solder joints without increasing the melting point. High temperature tensile tests of solder alloys and thermal fatigue tests of solder joints were conducted to validate the improvement. SEM observation further clarified the corresponding microstructure modification. Finally, the effect of adding small amount of La was deeply studied based upon thermodynamic models and eutectic growth kinetics.","PeriodicalId":297053,"journal":{"name":"Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548)","volume":"528 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-07-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"High reliable solder joints using Sn-Pb-La solder alloy\",\"authors\":\"X. Ma, Y. Qian, F. Liu, F. Yoshida\",\"doi\":\"10.1109/IPFA.2001.941456\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Reliability of solder joints is essential to electronic packaging since they provide both the mechanical and electrical connections at PCB level assembly. Several efforts have been made to improve the mechanical properties of traditional Sn60-Pb40 solder alloys by adding small amounts of alloy elements, such as Ag, Sb, Cu, Pd, etc. (Vaynman et al., 1998; Takemoto et al., 1997; Devore, 1982). Although the provided experimental data illustrated the effect of improvements, the corresponding modification mechanism had been little discussed. In this work, a small amount of rare earth element La was added to Sn60-Pb40 solder in order to improve the reliability of solder joints without increasing the melting point. High temperature tensile tests of solder alloys and thermal fatigue tests of solder joints were conducted to validate the improvement. SEM observation further clarified the corresponding microstructure modification. Finally, the effect of adding small amount of La was deeply studied based upon thermodynamic models and eutectic growth kinetics.\",\"PeriodicalId\":297053,\"journal\":{\"name\":\"Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548)\",\"volume\":\"528 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-07-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPFA.2001.941456\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2001.941456","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

焊点的可靠性对电子封装至关重要,因为它们在PCB级组装中提供机械和电气连接。通过添加少量的合金元素,如Ag、Sb、Cu、Pd等,已经做出了一些努力来改善传统Sn60-Pb40钎料合金的机械性能(Vaynman et al., 1998;Takemoto等人,1997;德沃尔,1982)。虽然提供的实验数据说明了改进的效果,但对相应的改性机理却很少讨论。在Sn60-Pb40焊料中加入少量稀土元素La,在不提高焊点熔点的情况下提高焊点的可靠性。通过对钎料合金的高温拉伸试验和焊点的热疲劳试验验证了改进的有效性。SEM观察进一步明确了相应的显微组织改性。最后,基于热力学模型和共晶生长动力学,深入研究了添加少量La的影响。
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High reliable solder joints using Sn-Pb-La solder alloy
Reliability of solder joints is essential to electronic packaging since they provide both the mechanical and electrical connections at PCB level assembly. Several efforts have been made to improve the mechanical properties of traditional Sn60-Pb40 solder alloys by adding small amounts of alloy elements, such as Ag, Sb, Cu, Pd, etc. (Vaynman et al., 1998; Takemoto et al., 1997; Devore, 1982). Although the provided experimental data illustrated the effect of improvements, the corresponding modification mechanism had been little discussed. In this work, a small amount of rare earth element La was added to Sn60-Pb40 solder in order to improve the reliability of solder joints without increasing the melting point. High temperature tensile tests of solder alloys and thermal fatigue tests of solder joints were conducted to validate the improvement. SEM observation further clarified the corresponding microstructure modification. Finally, the effect of adding small amount of La was deeply studied based upon thermodynamic models and eutectic growth kinetics.
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