基于可扩展分段的恶意电路检测与诊断

Sheng Wei, M. Potkonjak
{"title":"基于可扩展分段的恶意电路检测与诊断","authors":"Sheng Wei, M. Potkonjak","doi":"10.5555/2133429.2133530","DOIUrl":null,"url":null,"abstract":"Hardware Trojans (HTs) pose a significant threat to the modern and pending integrated circuit (IC). Several approaches have been proposed to detect HTs, but they are either incapable of detecting HTs under the presence of process variation (PV) or unable to handle very large circuits in the modern IC industry. We develop a scalable HT detection and diagnosis scheme by using segmentation techniques and gate level characterization (GLC). In order to address the scalability issue, we propose a segmentation method which divides the large circuit into small sub-circuits by using input vector control. We propose a segment selection model in terms of properties of segments and their effects on GLC accuracy. The model parameters are calibrated by sampled data from the GLC process. Based on the selected segments we are able to detect and diagnose HTs correctly by tracing gate level leakage power. We evaluate our approach on several ISCAS85/ISCAS89/ITC99 benchmarks. The simulation results show that our approach is capable of detecting and diagnosing HTs accurately on large circuits.","PeriodicalId":344703,"journal":{"name":"2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"32","resultStr":"{\"title\":\"Scalable segmentation-based malicious circuitry detection and diagnosis\",\"authors\":\"Sheng Wei, M. Potkonjak\",\"doi\":\"10.5555/2133429.2133530\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Hardware Trojans (HTs) pose a significant threat to the modern and pending integrated circuit (IC). Several approaches have been proposed to detect HTs, but they are either incapable of detecting HTs under the presence of process variation (PV) or unable to handle very large circuits in the modern IC industry. We develop a scalable HT detection and diagnosis scheme by using segmentation techniques and gate level characterization (GLC). In order to address the scalability issue, we propose a segmentation method which divides the large circuit into small sub-circuits by using input vector control. We propose a segment selection model in terms of properties of segments and their effects on GLC accuracy. The model parameters are calibrated by sampled data from the GLC process. Based on the selected segments we are able to detect and diagnose HTs correctly by tracing gate level leakage power. We evaluate our approach on several ISCAS85/ISCAS89/ITC99 benchmarks. The simulation results show that our approach is capable of detecting and diagnosing HTs accurately on large circuits.\",\"PeriodicalId\":344703,\"journal\":{\"name\":\"2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-11-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"32\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.5555/2133429.2133530\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.5555/2133429.2133530","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 32

摘要

硬件木马(ht)对现代集成电路(IC)构成了重大威胁。已经提出了几种检测高温超导的方法,但它们要么无法在工艺变化(PV)的存在下检测高温超导,要么无法处理现代集成电路工业中非常大的电路。我们通过使用分割技术和门电平表征(GLC)开发了可扩展的高温检测和诊断方案。为了解决可扩展性问题,我们提出了一种利用输入矢量控制将大电路分割成小电路的分割方法。我们提出了一个分段选择模型,根据分段的性质及其对GLC精度的影响。模型参数由GLC过程的采样数据校准。在此基础上,通过对栅极泄漏功率的跟踪,可以正确地检测和诊断高温高温。我们在几个ISCAS85/ISCAS89/ITC99基准上评估了我们的方法。仿真结果表明,该方法能够准确地检测和诊断大型电路中的高频故障。
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Scalable segmentation-based malicious circuitry detection and diagnosis
Hardware Trojans (HTs) pose a significant threat to the modern and pending integrated circuit (IC). Several approaches have been proposed to detect HTs, but they are either incapable of detecting HTs under the presence of process variation (PV) or unable to handle very large circuits in the modern IC industry. We develop a scalable HT detection and diagnosis scheme by using segmentation techniques and gate level characterization (GLC). In order to address the scalability issue, we propose a segmentation method which divides the large circuit into small sub-circuits by using input vector control. We propose a segment selection model in terms of properties of segments and their effects on GLC accuracy. The model parameters are calibrated by sampled data from the GLC process. Based on the selected segments we are able to detect and diagnose HTs correctly by tracing gate level leakage power. We evaluate our approach on several ISCAS85/ISCAS89/ITC99 benchmarks. The simulation results show that our approach is capable of detecting and diagnosing HTs accurately on large circuits.
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