带有微凸点的3D晶圆薄壁预组装工艺的挑战与解决方案

A. Podpod, C. Demeurisse, C. Gerets, K. Rebibis, G. Capuz, F. Duval, A. Phommahaxay, E. Sleeckx, H. Struyf, R. A. Miller, G. Beyer, E. Beyne
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引用次数: 6

摘要

在3D集成电路技术中,临时键合系统和堆叠/组装工艺被认为是关键因素,考虑到BEOL工艺中晶圆处理的所有问题,以及如何在这么多不同的方案中尽可能做到最好的堆叠。在临时粘合系统和堆叠/组装过程之间,是连接两者的一组和一系列过程。这就是通常所说的预装配过程。本文介绍了带有微凸点的薄晶圆的内部预组装3D集成电路工艺流程,以及每一步在材料和工艺上的不同挑战。最重要的是,本文报告了一种解决方案,该解决方案使预组装过程能够成功地提供从临时粘合系统到堆叠/组装过程的桥梁:一种UV切割带,可以在预组装集成中处理带有背面微凸起的薄3D IC晶圆时处理手上的复杂性。
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Challenges and solutions on pre-assembly processes for thinned 3D wafers with micro-bumps on the backside
In 3D IC technology, temporary bonding systems and stacking/assembly process are identified as critical elements given all the concerns on wafer handling amidst BEOL processes and how to do the stacking as best as one could in so many different schemes. In between the temporary bonding systems and stacking/assembly process, is a group and series of processes that link the two. This is collectively and commonly known as the pre-assembly process. This paper presents the in-house pre-assembly 3D IC process flow for thinned wafer with micro-bumps on the backside along with the different challenges on materials and processes on each step. Most importantly, this paper reports on a solution found that enabled pre-assembly process to successfully provide a bridge from temporary bonding systems to stacking/assembly process: a UV dicing tape that can handle the complexities at hand when processing thinned 3D IC wafers with backside micro bumps in pre-assembly integration.
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