冗余——不再只是针对缺陷

Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004. Pub Date : 2004-08-30 DOI:10.1109/MTDT.2004.19

R. Aitken

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引用次数: 4

摘要

本文展示了工艺变化如何影响内存裕度和性能，并表明在某些情况下，除了对缺陷的良率恢复外，还可以使用额外的冗余能力来恢复由于工艺变化而导致的良率。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Redundancy - it's not just for defects any more

This paper shows how process variation affects memory margin and performance, and shows that in some cases additional redundancy capability can be used to recover yield due to process variation in addition to yield recovery for defects.

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Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004.

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