激光直接刻写三维微结构用三硫化硫系砷玻璃的制备及性能研究

C. Schwarz, H. E. Williams, C. Grabill, A. M. Lewis, S. Kuebler, Benn Gleason, K. Richardson, A. Pogrebnyakov, T. Mayer, C. Drake, C. Rivero‐Baleine
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引用次数: 5

摘要

三硫化砷(As2S3)是一种厚度为~620 nm ~ 11 μm的透明材料,可直接应用于传感器、光子波导和声光学等领域。As2S3可以热沉积形成分子硫族化物(ChG)簇的玻璃膜。研究表明,线性和多光子曝光可以用于热沉积As2S3的光模式。曝光使胶片交联成网状固体。用极性溶剂处理照相图案材料可去除未曝光的材料,留下照相图案的负色调复制品结构。在这项工作中,采用多光子直接激光写入(DLW)技术在As2S3薄膜上进行了纳米结构阵列的光谱化,并对所得到的结构、形貌和化学成分进行了表征,并将其与热沉积、光谱化照射和蚀刻加工的条件进行了关联。利用拉曼光谱对未曝光材料和曝光材料的化学结构进行表征,利用近红外椭偏仪测量材料的折射率。物理表征包括纳米尺度的结构尺寸和表面附着力等特征与加工条件有关。
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Processing and properties of arsenic trisulfide chalcogenide glasses for direct laser writing of 3D microstructures
Arsenic trisulfide (As2S3) is a transparent material from ~620 nm to 11 μm with direct applications in sensors, photonic waveguides, and acousto-optics. As2S3 may be thermally deposited to form glassy films of molecular chalcogenide (ChG) clusters. It has been shown that linear and multi-photon exposure can be used to photo-pattern thermally deposited As2S3. Photo-exposure cross-links the film into a network solid. Treating the photo-patterned material with a polarsolvent removes the unexposed material leaving behind a structure that is a negative-tone replica of the photo-pattern. In this work, nano-structure arrays were photo-patterned in As2S3 films by multi-photon direct laser writing (DLW) and the resulting structure, morphology, and chemical composition were characterized and correlated with the conditions of the thermal deposition, patterned irradiation, and etch processing. Raman spectroscopy was used to characterize the chemical structure of the unexposed and photo-exposed material, and near infrared ellipsometry was used to measure the refractive index. Physical characterization including structure size and surface adhesion of nano-scale features is related to the processing conditions.
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