TFET与FinFET差分对的性能比较

M. D. V. Martino, J. Martino, P. Agopian
{"title":"TFET与FinFET差分对的性能比较","authors":"M. D. V. Martino, J. Martino, P. Agopian","doi":"10.1109/SBMICRO.2015.7298136","DOIUrl":null,"url":null,"abstract":"The goal of this work is to analyze the suitability of TFET and FinFET transistors in a differential pair. A quantitative comparison has been made based on the differential gain, the common-mode gain and the common-mode rejection ratio for each case. The first part of this work focused on perfectly matched circuits and explained the difference observed in the absolute values and in the susceptibility to the input voltage variation. The obtained curves have been explained based on the prevailing transport mechanisms for each case and its consequence on parameters such as transistor transconductance and output resistance. The second part highlighted the impact of mismatched transistors on the extracted results. The variation and the final result for each parameter have been analyzed. It was observed that TFETs presented better absolute values for the three highlighted parameters and better behavior for higher channel lengths. However, these devices have been more susceptible to the input voltage variation and to the decrease of channel length.","PeriodicalId":342493,"journal":{"name":"2015 30th Symposium on Microelectronics Technology and Devices (SBMicro)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Performance comparison between TFET and FinFET differential pair\",\"authors\":\"M. D. V. Martino, J. Martino, P. Agopian\",\"doi\":\"10.1109/SBMICRO.2015.7298136\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The goal of this work is to analyze the suitability of TFET and FinFET transistors in a differential pair. A quantitative comparison has been made based on the differential gain, the common-mode gain and the common-mode rejection ratio for each case. The first part of this work focused on perfectly matched circuits and explained the difference observed in the absolute values and in the susceptibility to the input voltage variation. The obtained curves have been explained based on the prevailing transport mechanisms for each case and its consequence on parameters such as transistor transconductance and output resistance. The second part highlighted the impact of mismatched transistors on the extracted results. The variation and the final result for each parameter have been analyzed. It was observed that TFETs presented better absolute values for the three highlighted parameters and better behavior for higher channel lengths. However, these devices have been more susceptible to the input voltage variation and to the decrease of channel length.\",\"PeriodicalId\":342493,\"journal\":{\"name\":\"2015 30th Symposium on Microelectronics Technology and Devices (SBMicro)\",\"volume\":\"34 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 30th Symposium on Microelectronics Technology and Devices (SBMicro)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SBMICRO.2015.7298136\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 30th Symposium on Microelectronics Technology and Devices (SBMicro)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SBMICRO.2015.7298136","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

这项工作的目的是分析在差分对中使用TFET和FinFET晶体管的适用性。对每种情况下的差分增益、共模增益和共模抑制比进行了定量比较。本工作的第一部分着重于完美匹配电路,并解释了在绝对值和对输入电压变化的敏感性方面观察到的差异。根据每种情况下的主流输运机制及其对晶体管跨导和输出电阻等参数的影响,对所得曲线进行了解释。第二部分强调了错配晶体管对提取结果的影响。对各参数的变化规律和最终结果进行了分析。观察到,tfet在三个突出显示的参数中表现出更好的绝对值,并且在更长的通道长度中表现出更好的行为。然而,这些器件更容易受到输入电压变化和通道长度减小的影响。
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Performance comparison between TFET and FinFET differential pair
The goal of this work is to analyze the suitability of TFET and FinFET transistors in a differential pair. A quantitative comparison has been made based on the differential gain, the common-mode gain and the common-mode rejection ratio for each case. The first part of this work focused on perfectly matched circuits and explained the difference observed in the absolute values and in the susceptibility to the input voltage variation. The obtained curves have been explained based on the prevailing transport mechanisms for each case and its consequence on parameters such as transistor transconductance and output resistance. The second part highlighted the impact of mismatched transistors on the extracted results. The variation and the final result for each parameter have been analyzed. It was observed that TFETs presented better absolute values for the three highlighted parameters and better behavior for higher channel lengths. However, these devices have been more susceptible to the input voltage variation and to the decrease of channel length.
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