{"title":"一种具有内置时间误差检测和校正的节能弹性触发器电路","authors":"Che-Min Huang, Tsung-Te Liu, T. Chiueh","doi":"10.1109/VLSI-DAT.2015.7114574","DOIUrl":null,"url":null,"abstract":"This paper presents a timing error resilient flip-flop (ERFF) circuit with high energy-efficiency. The proposed flip-flop design automatically corrects timing errors and therefore minimizes the performance degradation due to variations. The simulation results show that the proposed design can achieve better energy-efficiency in ISCAS'89 benchmark circuits and LEON3 integer-processing unit, when compared to other state-of-the-art timing error detection and correction methods.","PeriodicalId":369130,"journal":{"name":"VLSI Design, Automation and Test(VLSI-DAT)","volume":"64 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"An energy-efficient resilient flip-flop circuit with built-in timing-error detection and correction\",\"authors\":\"Che-Min Huang, Tsung-Te Liu, T. Chiueh\",\"doi\":\"10.1109/VLSI-DAT.2015.7114574\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a timing error resilient flip-flop (ERFF) circuit with high energy-efficiency. The proposed flip-flop design automatically corrects timing errors and therefore minimizes the performance degradation due to variations. The simulation results show that the proposed design can achieve better energy-efficiency in ISCAS'89 benchmark circuits and LEON3 integer-processing unit, when compared to other state-of-the-art timing error detection and correction methods.\",\"PeriodicalId\":369130,\"journal\":{\"name\":\"VLSI Design, Automation and Test(VLSI-DAT)\",\"volume\":\"64 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-04-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"VLSI Design, Automation and Test(VLSI-DAT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSI-DAT.2015.7114574\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"VLSI Design, Automation and Test(VLSI-DAT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSI-DAT.2015.7114574","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An energy-efficient resilient flip-flop circuit with built-in timing-error detection and correction
This paper presents a timing error resilient flip-flop (ERFF) circuit with high energy-efficiency. The proposed flip-flop design automatically corrects timing errors and therefore minimizes the performance degradation due to variations. The simulation results show that the proposed design can achieve better energy-efficiency in ISCAS'89 benchmark circuits and LEON3 integer-processing unit, when compared to other state-of-the-art timing error detection and correction methods.