JS-002模块和产品CDM结果与JEDEC和ESDA CDM方法的比较

2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) Pub Date : 2016-09-01 DOI:10.1109/EOSESD.2016.7592541

A. Righter, R. Ashton, B. Carn, M. Johnson, B. Reynolds, T. Smedes, S. Ward, H. Wolf

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引用次数: 2

摘要

介绍了CDM标准JS-002，包括其开发的原因和新标准解决的技术问题。在波形和集成电路合格/不合格水平方面，JS-002与JEDEC JESD22-C101、ESDA和AEC Q100 CDM标准进行了比较。JS-002稳健性水平与JEDEC CDM水平相似。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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JS-002 module and product CDM result comparison to JEDEC and ESDA CDM methods

CDM standard JS-002 is introduced, including the reasons for its development and the technical issues the new standard addresses. JS-002 is compared to the JEDEC JESD22-C101, ESDA and AEC Q100 CDM standards in terms of waveforms and integrated circuit pass/fail levels. JS-002 robustness levels are similar to JEDEC CDM levels.

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2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

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