热中子:对超级计算机和安全关键应用的可能威胁

Daniel Oliveira, S. Blanchard, Nathan Debardeleben, F. Santos, Gabriel Piscoya Dávila, P. Navaux, C. Cazzaniga, C. Frost, R. Baumann, P. Rech
{"title":"热中子:对超级计算机和安全关键应用的可能威胁","authors":"Daniel Oliveira, S. Blanchard, Nathan Debardeleben, F. Santos, Gabriel Piscoya Dávila, P. Navaux, C. Cazzaniga, C. Frost, R. Baumann, P. Rech","doi":"10.1109/ETS48528.2020.9131597","DOIUrl":null,"url":null,"abstract":"The high performance, high efficiency, and low cost of Commercial Off-The-Shelf (COTS) devices make them attractive for applications with strict reliability constraints. Today, COTS devices are adopted in HPC and safety-critical applications such as autonomous driving. Unfortunately, the cheap natural Boron widely used in COTS chip manufacturing process makes them highly susceptible to thermal (low energy) neutrons. In this paper, we demonstrate that thermal neutrons are a significant threat to COTS device reliability. For our study, we consider an AMD APU, three NVIDIA GPUs, an Intel accelerator, and an FPGA executing a relevant set of algorithms. We consider different scenarios that impact the thermal neutron flux such as weather, concrete walls and floors, and HPC liquid cooling systems. We show that thermal neutrons FIT rate could be comparable to the high energy neutron FIT rate.","PeriodicalId":267309,"journal":{"name":"2020 IEEE European Test Symposium (ETS)","volume":"87 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Thermal Neutrons: a Possible Threat for Supercomputers and Safety Critical Applications\",\"authors\":\"Daniel Oliveira, S. Blanchard, Nathan Debardeleben, F. Santos, Gabriel Piscoya Dávila, P. Navaux, C. Cazzaniga, C. Frost, R. Baumann, P. Rech\",\"doi\":\"10.1109/ETS48528.2020.9131597\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The high performance, high efficiency, and low cost of Commercial Off-The-Shelf (COTS) devices make them attractive for applications with strict reliability constraints. Today, COTS devices are adopted in HPC and safety-critical applications such as autonomous driving. Unfortunately, the cheap natural Boron widely used in COTS chip manufacturing process makes them highly susceptible to thermal (low energy) neutrons. In this paper, we demonstrate that thermal neutrons are a significant threat to COTS device reliability. For our study, we consider an AMD APU, three NVIDIA GPUs, an Intel accelerator, and an FPGA executing a relevant set of algorithms. We consider different scenarios that impact the thermal neutron flux such as weather, concrete walls and floors, and HPC liquid cooling systems. We show that thermal neutrons FIT rate could be comparable to the high energy neutron FIT rate.\",\"PeriodicalId\":267309,\"journal\":{\"name\":\"2020 IEEE European Test Symposium (ETS)\",\"volume\":\"87 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE European Test Symposium (ETS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ETS48528.2020.9131597\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE European Test Symposium (ETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS48528.2020.9131597","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

商用现货(COTS)设备的高性能、高效率和低成本使它们对具有严格可靠性约束的应用具有吸引力。如今,COTS设备被用于高性能计算和自动驾驶等安全关键应用。不幸的是,在COTS芯片制造过程中广泛使用的廉价天然硼使它们极易受到热(低能)中子的影响。在本文中,我们证明了热中子是对COTS器件可靠性的重大威胁。在我们的研究中,我们考虑了一个AMD APU,三个NVIDIA gpu,一个英特尔加速器和一个执行相关算法集的FPGA。我们考虑了影响热中子通量的不同情况,如天气、混凝土墙壁和地板以及高性能计算液体冷却系统。我们发现热中子的FIT率可以与高能中子的FIT率相媲美。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Thermal Neutrons: a Possible Threat for Supercomputers and Safety Critical Applications
The high performance, high efficiency, and low cost of Commercial Off-The-Shelf (COTS) devices make them attractive for applications with strict reliability constraints. Today, COTS devices are adopted in HPC and safety-critical applications such as autonomous driving. Unfortunately, the cheap natural Boron widely used in COTS chip manufacturing process makes them highly susceptible to thermal (low energy) neutrons. In this paper, we demonstrate that thermal neutrons are a significant threat to COTS device reliability. For our study, we consider an AMD APU, three NVIDIA GPUs, an Intel accelerator, and an FPGA executing a relevant set of algorithms. We consider different scenarios that impact the thermal neutron flux such as weather, concrete walls and floors, and HPC liquid cooling systems. We show that thermal neutrons FIT rate could be comparable to the high energy neutron FIT rate.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs Accurate Measurements of Small Resistances in Vertical Interconnects with Small Aspect Ratios Anomaly Detection in Embedded Systems Using Power and Memory Side Channels The Risk of Outsourcing: Hidden SCA Trojans in Third-Party IP-Cores Threaten Cryptographic ICs A SIFT-based Waveform Clustering Method for aiding analog/mixed-signal IC Verification
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1