Pub Date : 2020-05-01DOI: 10.1109/ETS48528.2020.9131559
Lizhou Wu, M. Fieback, M. Taouil, S. Hamdioui
This paper introduces a new test approach: device-aware test (DAT) for emerging memory technologies such as MRAM, RRAM, and PCM. The DAT approach enables accurate models of device defects to obtain realistic fault models, which are used to develop high-quality and optimized test solutions. This is demonstrated by an application of DAT to pinhole defects in STT-MRAMs and forming defects in RRAMs.
{"title":"Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level","authors":"Lizhou Wu, M. Fieback, M. Taouil, S. Hamdioui","doi":"10.1109/ETS48528.2020.9131559","DOIUrl":"https://doi.org/10.1109/ETS48528.2020.9131559","url":null,"abstract":"This paper introduces a new test approach: device-aware test (DAT) for emerging memory technologies such as MRAM, RRAM, and PCM. The DAT approach enables accurate models of device defects to obtain realistic fault models, which are used to develop high-quality and optimized test solutions. This is demonstrated by an application of DAT to pinhole defects in STT-MRAMs and forming defects in RRAMs.","PeriodicalId":267309,"journal":{"name":"2020 IEEE European Test Symposium (ETS)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122927186","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-05-01DOI: 10.1109/ETS48528.2020.9131583
S. Masoumian, G. Selimis, Roel Maes, G. Schrijen, S. Hamdioui, M. Taouil
In this paper, we develop an analytical PUF model based on a compact FinFET transistor model that calculates the PUF stability (i.e. PUF static noise margin (PSNM)) for FinFET based SRAMs. The model enables a quick design space exploration and may be used to identify critical parameters that affect the PSNM. The analytical model is validated with SPICE simulations. In our experiments, we analyze the impact of process variation, technology, and temperature on the PSNM. The results show that the analytical model matches very well with the simulation model. From the experiments we conclude the following: (1) nFET variations have a larger impact on the PSNM than pFET (1.5% higher PSNM in nFET variations than pFET variations at 25°C), (2) high performance SRAM cells are more skewed (1.3% higher PSNM) (3) the reproducibility increases with smaller technology nodes (0.8% PSNM increase from 20 to 14 nm) (4) increasing the temperature from −10°C to 120°C leads to a PSNM change of approximately 1.0% for an extreme nFET channel length.
{"title":"Modeling Static Noise Margin for FinFET based SRAM PUFs","authors":"S. Masoumian, G. Selimis, Roel Maes, G. Schrijen, S. Hamdioui, M. Taouil","doi":"10.1109/ETS48528.2020.9131583","DOIUrl":"https://doi.org/10.1109/ETS48528.2020.9131583","url":null,"abstract":"In this paper, we develop an analytical PUF model based on a compact FinFET transistor model that calculates the PUF stability (i.e. PUF static noise margin (PSNM)) for FinFET based SRAMs. The model enables a quick design space exploration and may be used to identify critical parameters that affect the PSNM. The analytical model is validated with SPICE simulations. In our experiments, we analyze the impact of process variation, technology, and temperature on the PSNM. The results show that the analytical model matches very well with the simulation model. From the experiments we conclude the following: (1) nFET variations have a larger impact on the PSNM than pFET (1.5% higher PSNM in nFET variations than pFET variations at 25°C), (2) high performance SRAM cells are more skewed (1.3% higher PSNM) (3) the reproducibility increases with smaller technology nodes (0.8% PSNM increase from 20 to 14 nm) (4) increasing the temperature from −10°C to 120°C leads to a PSNM change of approximately 1.0% for an extreme nFET channel length.","PeriodicalId":267309,"journal":{"name":"2020 IEEE European Test Symposium (ETS)","volume":"126 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124208647","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-05-01DOI: 10.1109/ETS48528.2020.9131600
Zahra Paria Najafi-Haghi, Marzieh Hashemipour-Nazari, H. Wunderlich
Small Delay Faults (SDFs) are an indicator of reliability threats even if they do not affect the behavior of a system at nominal speed. Various defects may evolve over time into a complete system failure, and defects have to be distinguished from delays due to process variations which also change the circuit timing but are benign. Based on Monte-Carlo electrical simulation at cell level, in this work it is shown that a few measurements at different operating points of voltage and frequency are sufficient to identify a defect cell even if its behavior is completely within the specification range. The developed classifier is based on statistical learning and can be annotated to each element of a cell library to support manufacturing test, diagnosis and optimizing the burn-in process or yield.
{"title":"Variation-Aware Defect Characterization at Cell Level","authors":"Zahra Paria Najafi-Haghi, Marzieh Hashemipour-Nazari, H. Wunderlich","doi":"10.1109/ETS48528.2020.9131600","DOIUrl":"https://doi.org/10.1109/ETS48528.2020.9131600","url":null,"abstract":"Small Delay Faults (SDFs) are an indicator of reliability threats even if they do not affect the behavior of a system at nominal speed. Various defects may evolve over time into a complete system failure, and defects have to be distinguished from delays due to process variations which also change the circuit timing but are benign. Based on Monte-Carlo electrical simulation at cell level, in this work it is shown that a few measurements at different operating points of voltage and frequency are sufficient to identify a defect cell even if its behavior is completely within the specification range. The developed classifier is based on statistical learning and can be annotated to each element of a cell library to support manufacturing test, diagnosis and optimizing the burn-in process or yield.","PeriodicalId":267309,"journal":{"name":"2020 IEEE European Test Symposium (ETS)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126509768","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-05-01DOI: 10.1109/ETS48528.2020.9131566
Pascal Raiola, Tobias Paxian, B. Becker
Reconfigurable Scan Networks (RSNs) allow flexible access to embedded instruments for post-silicon validation and debug or diagnosis. However, the increased observability and controllability can be exploited by an attacker to manipulate or read out sensitive data, if no adequate precautions are taken by the designer. For large RSNs taking those precautions without algorithmic support is virtually impossible. This work proposes a method to automatically generate “minimal witnesses” demonstrating security weaknesses w.r.t. data flow in RSNs. The method provides condensed information to the designer on how to prevent data flow attacks, e.g. by locally modifying the RSN or by preventing active scan paths which contain those minimal witnesses. Experimental results confirm the applicability of the proposed method to diverse benchmark sets, including large designs. Additionally, the benefit of generating “minimal witnesses” for security weaknesses is shown.
{"title":"Minimal Witnesses for Security Weaknesses in Reconfigurable Scan Networks","authors":"Pascal Raiola, Tobias Paxian, B. Becker","doi":"10.1109/ETS48528.2020.9131566","DOIUrl":"https://doi.org/10.1109/ETS48528.2020.9131566","url":null,"abstract":"Reconfigurable Scan Networks (RSNs) allow flexible access to embedded instruments for post-silicon validation and debug or diagnosis. However, the increased observability and controllability can be exploited by an attacker to manipulate or read out sensitive data, if no adequate precautions are taken by the designer. For large RSNs taking those precautions without algorithmic support is virtually impossible. This work proposes a method to automatically generate “minimal witnesses” demonstrating security weaknesses w.r.t. data flow in RSNs. The method provides condensed information to the designer on how to prevent data flow attacks, e.g. by locally modifying the RSN or by preventing active scan paths which contain those minimal witnesses. Experimental results confirm the applicability of the proposed method to diverse benchmark sets, including large designs. Additionally, the benefit of generating “minimal witnesses” for security weaknesses is shown.","PeriodicalId":267309,"journal":{"name":"2020 IEEE European Test Symposium (ETS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128534130","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-05-01DOI: 10.1109/ETS48528.2020.9131555
E. Larsson, Zehang Xiang, P. Murali
We address access control of reconfigurable scan networks, like IEEE Std. 1687 networks. We propose an on-chip test block to perform: (1) test for faulty scan-chains, (2) localization of faulty scan-chains and (3) repair by excluding faulty scan-chains, and an access control block to (1) control so scan-chains (instruments) are only accessed in allowed combinations, (2) detection of access attempts to instrument in not allowed combinations, and (3) monitoring how theses attempts are made. The key features are two-fold. First, in respect to operation and maintenance. If the physical implementation of an IEEE Std. 1687 network changes due to faults, the instrument connectivity language (ICL) and procedural description language (PDL) need to be updated. To avoid keeping track and updating ICL and PDL for each individual integrated circuit (IC), proposed test block, placed at each IC, makes adjustments of PDL according to the faults of the particular IC. Second, a centralized access control block with key information about the network to detect and handle unauthorized access.
{"title":"IEEE Std. P1687.1 for Access Control of Reconfigurable Scan Networks","authors":"E. Larsson, Zehang Xiang, P. Murali","doi":"10.1109/ETS48528.2020.9131555","DOIUrl":"https://doi.org/10.1109/ETS48528.2020.9131555","url":null,"abstract":"We address access control of reconfigurable scan networks, like IEEE Std. 1687 networks. We propose an on-chip test block to perform: (1) test for faulty scan-chains, (2) localization of faulty scan-chains and (3) repair by excluding faulty scan-chains, and an access control block to (1) control so scan-chains (instruments) are only accessed in allowed combinations, (2) detection of access attempts to instrument in not allowed combinations, and (3) monitoring how theses attempts are made. The key features are two-fold. First, in respect to operation and maintenance. If the physical implementation of an IEEE Std. 1687 network changes due to faults, the instrument connectivity language (ICL) and procedural description language (PDL) need to be updated. To avoid keeping track and updating ICL and PDL for each individual integrated circuit (IC), proposed test block, placed at each IC, makes adjustments of PDL according to the faults of the particular IC. Second, a centralized access control block with key information about the network to detect and handle unauthorized access.","PeriodicalId":267309,"journal":{"name":"2020 IEEE European Test Symposium (ETS)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128849975","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-05-01DOI: 10.1109/ETS48528.2020.9131580
Md Toufiq Hasan Anik, Rachit Saini, J. Danger, S. Guilley, Naghmeh Karimi
Timely notification of abnormal behaviors is essential in strategic systems requiring a high level of safety and security. Sensing environmental conditions to ensure that the device is not operating out-of-specifications is highly useful in detecting anomalies caused by failures or malevolent actions. Digital sensors consider the operating environmental conditions as a whole, i.e. they are sensitive to temperature, voltage and process altogether, without precise knowledge about each. This paper proposes a low-cost digital sensor that can detect system failures accurately in the designer's preferable range of operating conditions. Our experimental results show the high accuracy of this sensor in detecting circuits failure which occurred due to change of the operating temperature and supply voltage.
{"title":"Failure and Attack Detection by Digital Sensors","authors":"Md Toufiq Hasan Anik, Rachit Saini, J. Danger, S. Guilley, Naghmeh Karimi","doi":"10.1109/ETS48528.2020.9131580","DOIUrl":"https://doi.org/10.1109/ETS48528.2020.9131580","url":null,"abstract":"Timely notification of abnormal behaviors is essential in strategic systems requiring a high level of safety and security. Sensing environmental conditions to ensure that the device is not operating out-of-specifications is highly useful in detecting anomalies caused by failures or malevolent actions. Digital sensors consider the operating environmental conditions as a whole, i.e. they are sensitive to temperature, voltage and process altogether, without precise knowledge about each. This paper proposes a low-cost digital sensor that can detect system failures accurately in the designer's preferable range of operating conditions. Our experimental results show the high accuracy of this sensor in detecting circuits failure which occurred due to change of the operating temperature and supply voltage.","PeriodicalId":267309,"journal":{"name":"2020 IEEE European Test Symposium (ETS)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121532704","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-05-01DOI: 10.1109/ETS48528.2020.9131596
Jiho Park, Virinchi Roy Surabhi, P. Krishnamurthy, S. Garg, R. Karri, F. Khorrami
We propose multi-modal anomaly detection in embedded systems using time-correlated measurements of power consumption and memory accesses. Time series of power consumption of the processor and memory accesses between L2 cache and memory bus under known-good conditions are used to train one-class support vector machine (SVM) and isolation forest classifiers. These side channels have complementary anomaly detection capabilities. Experiments on a high-fidelity processor emulator show that the method accurately detects anomalies.
{"title":"Anomaly Detection in Embedded Systems Using Power and Memory Side Channels","authors":"Jiho Park, Virinchi Roy Surabhi, P. Krishnamurthy, S. Garg, R. Karri, F. Khorrami","doi":"10.1109/ETS48528.2020.9131596","DOIUrl":"https://doi.org/10.1109/ETS48528.2020.9131596","url":null,"abstract":"We propose multi-modal anomaly detection in embedded systems using time-correlated measurements of power consumption and memory accesses. Time series of power consumption of the processor and memory accesses between L2 cache and memory bus under known-good conditions are used to train one-class support vector machine (SVM) and isolation forest classifiers. These side channels have complementary anomaly detection capabilities. Experiments on a high-fidelity processor emulator show that the method accurately detects anomalies.","PeriodicalId":267309,"journal":{"name":"2020 IEEE European Test Symposium (ETS)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114633427","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-05-01DOI: 10.1109/ETS48528.2020.9131567
Min-Chun Hu, Zhan Gao, Santosh Malagi, J. Swenton, J. Huisken, K. Goossens, Cheng-Wen Wu, E. Marinissen
Cell-aware test (CAT) explicitly targets faults caused by cell-internal short and open defects and has been shown to significantly reduce test escape rates. CAT library cell characterization is typically done for only two defect resistance values: one representing hard opens and another one representing hard shorts. In this paper, similar to fishermen tightening the mesh size of their nets to catch small fish, we perform library characterization as efficiently as possible for a set of resistances representing increasingly weaker defects, and then adjust our ATPG flow to explicitly target faults caused by the weakest still-detectable variant of each potential defect. We implemented this novel approach in an experimental ATPG tool flow script, using functions of Cadence's Modus as building blocks. To assess the effectiveness of our approach, we formulate a new dedicated test metric: the weakest fault coverage wfc. Compared to conventional CAT targeting hard defects only, experimental results show that our new approach enhances detection of weakest faults and significantly reduces wfc escapes =1-wfc, while maintaining its original (hard-defect) fault coverage fc, of course at the expense of (acceptable) increases in the required number of test patterns and associated test generation time.
{"title":"Tightening the Mesh Size of the Cell-Aware ATPG Net for Catching All Detectable Weakest Faults","authors":"Min-Chun Hu, Zhan Gao, Santosh Malagi, J. Swenton, J. Huisken, K. Goossens, Cheng-Wen Wu, E. Marinissen","doi":"10.1109/ETS48528.2020.9131567","DOIUrl":"https://doi.org/10.1109/ETS48528.2020.9131567","url":null,"abstract":"Cell-aware test (CAT) explicitly targets faults caused by cell-internal short and open defects and has been shown to significantly reduce test escape rates. CAT library cell characterization is typically done for only two defect resistance values: one representing hard opens and another one representing hard shorts. In this paper, similar to fishermen tightening the mesh size of their nets to catch small fish, we perform library characterization as efficiently as possible for a set of resistances representing increasingly weaker defects, and then adjust our ATPG flow to explicitly target faults caused by the weakest still-detectable variant of each potential defect. We implemented this novel approach in an experimental ATPG tool flow script, using functions of Cadence's Modus as building blocks. To assess the effectiveness of our approach, we formulate a new dedicated test metric: the weakest fault coverage wfc. Compared to conventional CAT targeting hard defects only, experimental results show that our new approach enhances detection of weakest faults and significantly reduces wfc escapes =1-wfc, while maintaining its original (hard-defect) fault coverage fc, of course at the expense of (acceptable) increases in the required number of test patterns and associated test generation time.","PeriodicalId":267309,"journal":{"name":"2020 IEEE European Test Symposium (ETS)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128225161","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-05-01DOI: 10.1109/ETS48528.2020.9131571
M. Portolan, Vincent Reynaud, P. Maistri, R. Leveugle
The complexity of modern Systems-on-Chips is steadily increasing, which poses hard challenges for testing. In order to be able to face those challenges, several standards have been proposed through history, such as the latest IEEE 1687 on Reconfigurable Scan Networks (RSNs), which allows dynamic configuration of the test infrastructure for an easier access to embedded instruments and data. This ease of access, however, may constitute a serious threat from the point of view of security, as it may be used by an attacker as an entry point to the internal state of the circuit, especially if the test infrastructure is reused for life-time testing. Some approaches exist to protect the access, but their performances and security levels are limited by the legacy view of test as a static process. In this paper, we propose an innovative solution that exploits the dynamic nature of the IEEE 1687 standard to obtain an Authentication-based Secure Access framework able to provide a trusted and personalized interface to the test infrastructure depending on user-defined security levels.
{"title":"Dynamic Authentication-Based Secure Access to Test Infrastructure","authors":"M. Portolan, Vincent Reynaud, P. Maistri, R. Leveugle","doi":"10.1109/ETS48528.2020.9131571","DOIUrl":"https://doi.org/10.1109/ETS48528.2020.9131571","url":null,"abstract":"The complexity of modern Systems-on-Chips is steadily increasing, which poses hard challenges for testing. In order to be able to face those challenges, several standards have been proposed through history, such as the latest IEEE 1687 on Reconfigurable Scan Networks (RSNs), which allows dynamic configuration of the test infrastructure for an easier access to embedded instruments and data. This ease of access, however, may constitute a serious threat from the point of view of security, as it may be used by an attacker as an entry point to the internal state of the circuit, especially if the test infrastructure is reused for life-time testing. Some approaches exist to protect the access, but their performances and security levels are limited by the legacy view of test as a static process. In this paper, we propose an innovative solution that exploits the dynamic nature of the IEEE 1687 standard to obtain an Authentication-based Secure Access framework able to provide a trusted and personalized interface to the test infrastructure depending on user-defined security levels.","PeriodicalId":267309,"journal":{"name":"2020 IEEE European Test Symposium (ETS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128651318","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-05-01DOI: 10.1109/ETS48528.2020.9131590
Farimah Farahmandi, O. Sinanoglu, R. D. Blanton, S. Pagliarini
The current state of the integrated circuit (IC) ecosystem is that only a handful of foundries are at the forefront, continuously pushing the state of the art in transistor miniaturization. Establishing and maintaining a FinFET-capable foundry is a billion dollar endeavor. This scenario dictates that many companies and governments have to develop their systems and products by relying on 3rd party IC fabrication. The major caveat within this practice is that the procured silicon cannot be blindly trusted: a malicious foundry can effectively modify the layout of the IC, reverse engineer its IPs, and overproduce the entire chip. The Hardware Security community has proposed many countermeasures to these threats. Notably, obfuscation has gained a lot of traction - here, the intent is to hide the functionality from the untrusted foundry such that the aforementioned threats are hindered or mitigated. In this paper, we summarize the research efforts of three independent research groups towards achieving trustworthy ICs, even when fabricated in untrusted offshore foundries. We extensively address the use of logic locking and its many variants, as well as the use of high-level synthesis (HLS) as an obfuscation approach of its own.
{"title":"Design Obfuscation versus Test","authors":"Farimah Farahmandi, O. Sinanoglu, R. D. Blanton, S. Pagliarini","doi":"10.1109/ETS48528.2020.9131590","DOIUrl":"https://doi.org/10.1109/ETS48528.2020.9131590","url":null,"abstract":"The current state of the integrated circuit (IC) ecosystem is that only a handful of foundries are at the forefront, continuously pushing the state of the art in transistor miniaturization. Establishing and maintaining a FinFET-capable foundry is a billion dollar endeavor. This scenario dictates that many companies and governments have to develop their systems and products by relying on 3rd party IC fabrication. The major caveat within this practice is that the procured silicon cannot be blindly trusted: a malicious foundry can effectively modify the layout of the IC, reverse engineer its IPs, and overproduce the entire chip. The Hardware Security community has proposed many countermeasures to these threats. Notably, obfuscation has gained a lot of traction - here, the intent is to hide the functionality from the untrusted foundry such that the aforementioned threats are hindered or mitigated. In this paper, we summarize the research efforts of three independent research groups towards achieving trustworthy ICs, even when fabricated in untrusted offshore foundries. We extensively address the use of logic locking and its many variants, as well as the use of high-level synthesis (HLS) as an obfuscation approach of its own.","PeriodicalId":267309,"journal":{"name":"2020 IEEE European Test Symposium (ETS)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130081585","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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