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引用次数: 0

摘要

利用密度泛函理论研究了氧化β-Ga2O3中氧空位和氢杂质的迁移。在我们的研究中,我们使用了微推弹性带(NEB)方法来确定最小能量路径(MEP)和迁移障碍。中性和双带电氧空位被认为是Ga2O3中最常见的内在缺陷。此外,氢是一种常见的背景杂质。我们的结果表明,这些缺陷在生长温度下是可移动的。
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First principles study of the diffusion of oxygen vacancies in Ga2O3
Using Density Functional Theory we have investigated the migration of oxygen vacancies and hydrogen impurities in the oxide β-Ga2O3. For our studies we used the Nudged Elastic Band (NEB) method in order to determine the Minimum Energy Paths (MEP) and the migration barriers. Neutral and doubly charged oxygen vacancies are considered to be the most common intrinsic defects in Ga2O3. In addition, hydrogen is a common background impurity. Our results indicate that these defects are mobile at growth temperatures.
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