M. Arnaout, Ahmad Ghizzawi, Ali Al-Hajj Hassan, Ali Koubayssi, M. Kafal, Ziad Noun
{"title":"基于机器学习技术的故障检测与分类","authors":"M. Arnaout, Ahmad Ghizzawi, Ali Al-Hajj Hassan, Ali Koubayssi, M. Kafal, Ziad Noun","doi":"10.1109/ICM52667.2021.9664906","DOIUrl":null,"url":null,"abstract":"In order to follow the technological evolution in the 21st century, and to detect the fault with the minimal effort spent, this paper was developed to identify the open and short circuit faults that may occur in the lighting and socket grids used in residential area while using machine learning algorithms. In this research, two cable networks were formed (the first one has a short circuit fault, and the second with an open circuit fault), then a neural network was used in order to detect these faults. Finally, several results will be shown that lead to verify the adequacy of the proposed method.","PeriodicalId":212613,"journal":{"name":"2021 International Conference on Microelectronics (ICM)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"The Detection and Classification of Faults by the Use of Machine Learning Technique\",\"authors\":\"M. Arnaout, Ahmad Ghizzawi, Ali Al-Hajj Hassan, Ali Koubayssi, M. Kafal, Ziad Noun\",\"doi\":\"10.1109/ICM52667.2021.9664906\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In order to follow the technological evolution in the 21st century, and to detect the fault with the minimal effort spent, this paper was developed to identify the open and short circuit faults that may occur in the lighting and socket grids used in residential area while using machine learning algorithms. In this research, two cable networks were formed (the first one has a short circuit fault, and the second with an open circuit fault), then a neural network was used in order to detect these faults. Finally, several results will be shown that lead to verify the adequacy of the proposed method.\",\"PeriodicalId\":212613,\"journal\":{\"name\":\"2021 International Conference on Microelectronics (ICM)\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-12-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 International Conference on Microelectronics (ICM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICM52667.2021.9664906\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 International Conference on Microelectronics (ICM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICM52667.2021.9664906","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The Detection and Classification of Faults by the Use of Machine Learning Technique
In order to follow the technological evolution in the 21st century, and to detect the fault with the minimal effort spent, this paper was developed to identify the open and short circuit faults that may occur in the lighting and socket grids used in residential area while using machine learning algorithms. In this research, two cable networks were formed (the first one has a short circuit fault, and the second with an open circuit fault), then a neural network was used in order to detect these faults. Finally, several results will be shown that lead to verify the adequacy of the proposed method.