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引用次数: 3

摘要

利用扫描电镜(SEM)、x射线荧光(EDX)和俄歇电子能谱(AES)分析系统研究了干簧继电器的冲击对电接点的影响。在实验的基础上,人们已经认识到机械冲击是这种继电器触点的一个严重问题,SEM, EDX和AES分析表明,由于冲击作用和大量的材料交换,接触区受到了相当大的破坏。接触电阻随冲击次数的增加而变化。结果表明,冲击作用会导致冲击磨损,阻力失效,或在相对少量的操作后无法释放(有时称为粘接)。提出了一个冲击作用模型并进行了试验。它也被用来研究撞击过程。
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Impact wear of electric contact
The impact effect on electrical contact of dry reed relay has been investigated with scanning electron microscopy (SEM), X-ray fluorescence (EDX), and Auger electron spectroscopy (AES) analytical systems. On the basis of experiments, it has been recognized that mechanical impact was a serious problem for this kind of relay contact, SEM, EDX, and AES analysis revealed that considerable damage of the contact zones resulted from the impact action and substantial exchange of material occurred. The contact resistance varied with increase of impact numbers. The results showed that impact action can lead to impact wear, resistance failure, or failures to release (sometimes called sticking) after a relatively small number of operations. A model of impact action was proposed and tested. It was also used to study the processes involved in impacting.<>
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