{"title":"改进语义分割应用中的深度神经网络容错性","authors":"Stéphane Burel, A. Evans, L. Anghel","doi":"10.1109/DFT56152.2022.9962354","DOIUrl":null,"url":null,"abstract":"Semantic segmentation of images is essential for autonomous driving and modern DNNs now achieve high accuracy. Automotive systems must comply with safety standards, requiring hardware fault detection. We present an analysis of the effect of faults using Google’s DeepLabV3+ network processing an industrial data-set. A new symptom-based fault detection algorithm is shown to detect >99% of critical faults with zero false positives and a compute overhead of 0.2%. Further, these faults can be masked, virtually eliminating all critical errors. To the authors’ knowledge this is the first fault tolerance study of a DNN semantic segmentation application.","PeriodicalId":411011,"journal":{"name":"2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Improving DNN Fault Tolerance in Semantic Segmentation Applications\",\"authors\":\"Stéphane Burel, A. Evans, L. Anghel\",\"doi\":\"10.1109/DFT56152.2022.9962354\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Semantic segmentation of images is essential for autonomous driving and modern DNNs now achieve high accuracy. Automotive systems must comply with safety standards, requiring hardware fault detection. We present an analysis of the effect of faults using Google’s DeepLabV3+ network processing an industrial data-set. A new symptom-based fault detection algorithm is shown to detect >99% of critical faults with zero false positives and a compute overhead of 0.2%. Further, these faults can be masked, virtually eliminating all critical errors. To the authors’ knowledge this is the first fault tolerance study of a DNN semantic segmentation application.\",\"PeriodicalId\":411011,\"journal\":{\"name\":\"2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-10-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFT56152.2022.9962354\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT56152.2022.9962354","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Improving DNN Fault Tolerance in Semantic Segmentation Applications
Semantic segmentation of images is essential for autonomous driving and modern DNNs now achieve high accuracy. Automotive systems must comply with safety standards, requiring hardware fault detection. We present an analysis of the effect of faults using Google’s DeepLabV3+ network processing an industrial data-set. A new symptom-based fault detection algorithm is shown to detect >99% of critical faults with zero false positives and a compute overhead of 0.2%. Further, these faults can be masked, virtually eliminating all critical errors. To the authors’ knowledge this is the first fault tolerance study of a DNN semantic segmentation application.