{"title":"使用非侵入式传感器的高速模拟电路的隐式测试","authors":"L. Abdallah, H. Stratigopoulos, S. Mir","doi":"10.1109/ECCTD.2011.6043627","DOIUrl":null,"url":null,"abstract":"Testing the analog functions of a system-on-chip makes up the major portion of test cost - up to 50% according to anecdotal evidence - although analog circuits occupy less than 5% of the die area. Furthermore, cases have been reported where the test cost actually surpasses the overall manufacturing cost. This shows that analog test is in the coming years an area for industry focus, innovation and improvement.","PeriodicalId":126960,"journal":{"name":"2011 20th European Conference on Circuit Theory and Design (ECCTD)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Implicit test of high-speed analog circuits using non-intrusive sensors\",\"authors\":\"L. Abdallah, H. Stratigopoulos, S. Mir\",\"doi\":\"10.1109/ECCTD.2011.6043627\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Testing the analog functions of a system-on-chip makes up the major portion of test cost - up to 50% according to anecdotal evidence - although analog circuits occupy less than 5% of the die area. Furthermore, cases have been reported where the test cost actually surpasses the overall manufacturing cost. This shows that analog test is in the coming years an area for industry focus, innovation and improvement.\",\"PeriodicalId\":126960,\"journal\":{\"name\":\"2011 20th European Conference on Circuit Theory and Design (ECCTD)\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-10-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 20th European Conference on Circuit Theory and Design (ECCTD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECCTD.2011.6043627\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 20th European Conference on Circuit Theory and Design (ECCTD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECCTD.2011.6043627","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Implicit test of high-speed analog circuits using non-intrusive sensors
Testing the analog functions of a system-on-chip makes up the major portion of test cost - up to 50% according to anecdotal evidence - although analog circuits occupy less than 5% of the die area. Furthermore, cases have been reported where the test cost actually surpasses the overall manufacturing cost. This shows that analog test is in the coming years an area for industry focus, innovation and improvement.
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