{"title":"嵌入式系统故障建模测试","authors":"Saumya Srivastava, A. Singh","doi":"10.1109/ELECTRO.2009.5441142","DOIUrl":null,"url":null,"abstract":"This paper deals with the problem of testing methods for testing embedded systems The problem addressed in this paper is about methods for testing whether impletation of system are correct . The problem of testing a system for its correctness deals with the designing of test cases .Test cases for correctness of the system with respect to specifications ,are large in number which makes the testing of embedded system infeasible. Robust testing of embedded system will help in solving this problem .Robust testing can be done by considering specifications as finite state machine.","PeriodicalId":149384,"journal":{"name":"2009 International Conference on Emerging Trends in Electronic and Photonic Devices & Systems","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Testing of embedded system using fault modeling\",\"authors\":\"Saumya Srivastava, A. Singh\",\"doi\":\"10.1109/ELECTRO.2009.5441142\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper deals with the problem of testing methods for testing embedded systems The problem addressed in this paper is about methods for testing whether impletation of system are correct . The problem of testing a system for its correctness deals with the designing of test cases .Test cases for correctness of the system with respect to specifications ,are large in number which makes the testing of embedded system infeasible. Robust testing of embedded system will help in solving this problem .Robust testing can be done by considering specifications as finite state machine.\",\"PeriodicalId\":149384,\"journal\":{\"name\":\"2009 International Conference on Emerging Trends in Electronic and Photonic Devices & Systems\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 International Conference on Emerging Trends in Electronic and Photonic Devices & Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ELECTRO.2009.5441142\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Conference on Emerging Trends in Electronic and Photonic Devices & Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ELECTRO.2009.5441142","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper deals with the problem of testing methods for testing embedded systems The problem addressed in this paper is about methods for testing whether impletation of system are correct . The problem of testing a system for its correctness deals with the designing of test cases .Test cases for correctness of the system with respect to specifications ,are large in number which makes the testing of embedded system infeasible. Robust testing of embedded system will help in solving this problem .Robust testing can be done by considering specifications as finite state machine.
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