Pub Date : 2009-12-01DOI: 10.1109/ELECTRO.2009.5441118
Uma Rathore Bhatt, S. Tokekar
This paper considers the problem of traffic engineering in multi domain optical networks. System simulations are performed to calculate the blocking probability of the network. The underlying theoretical model is given in support of system simulations. The paper suggests the optimum value of resources to reduce the blocking probability of the network with cost effectiveness. The methodology of the paper can be used for different kind of topologies for traffic engineering. The paper also gives the optimal value of wavelengths for different kind of traffic pattern for a network.
{"title":"Traffic engineering in multi domain optical networks","authors":"Uma Rathore Bhatt, S. Tokekar","doi":"10.1109/ELECTRO.2009.5441118","DOIUrl":"https://doi.org/10.1109/ELECTRO.2009.5441118","url":null,"abstract":"This paper considers the problem of traffic engineering in multi domain optical networks. System simulations are performed to calculate the blocking probability of the network. The underlying theoretical model is given in support of system simulations. The paper suggests the optimum value of resources to reduce the blocking probability of the network with cost effectiveness. The methodology of the paper can be used for different kind of topologies for traffic engineering. The paper also gives the optimal value of wavelengths for different kind of traffic pattern for a network.","PeriodicalId":149384,"journal":{"name":"2009 International Conference on Emerging Trends in Electronic and Photonic Devices & Systems","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114666246","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-12-01DOI: 10.1109/ELECTRO.2009.5441050
Dr. Jatindranath Gain, M. Sarkar, S. Kundu
This paper presents the Eigen values and corresponding Eigen functions for the electron states in an aperiodic and asymmetric Multiple Quantum Well structure. A faster, simpler, and accurate algorithm based on Transfer Matrix method has been introduced for solving time independent Schrödinger equation in the most general case of aperiodic and asymmetric MQW structure. The MQWs are aperiodic with varying well and barrier widths and asymmetric i.e., having different materials and effective masses for the different regions of the wells and barriers. Adjacent wells are coupled through the barriers. Effect of barrier width on the tunneling properties has also been investigated. The theoretical results are compared with experimental results of Giorgetta et all [1]. Results of the computation based on the general model agree well with experimental data.
本文给出了非周期非对称多量子阱结构中电子态的本征值和相应的本征函数。针对非周期非对称MQW结构的一般情况，提出了一种基于传递矩阵法的更快、更简单、更准确的求解时间无关Schrödinger方程的算法。mqw是非周期性的，具有不同的井和屏障宽度，并且不对称，即对于井和屏障的不同区域具有不同的材料和有效质量。相邻的井通过屏障进行耦合。研究了势垒宽度对隧道掘进性能的影响。将理论结果与Giorgetta et all[1]的实验结果进行了比较。基于一般模型的计算结果与实验数据吻合较好。
{"title":"Transfer Matrix method for computation of electron transmission through aperiodic MQW","authors":"Dr. Jatindranath Gain, M. Sarkar, S. Kundu","doi":"10.1109/ELECTRO.2009.5441050","DOIUrl":"https://doi.org/10.1109/ELECTRO.2009.5441050","url":null,"abstract":"This paper presents the Eigen values and corresponding Eigen functions for the electron states in an aperiodic and asymmetric Multiple Quantum Well structure. A faster, simpler, and accurate algorithm based on Transfer Matrix method has been introduced for solving time independent Schrödinger equation in the most general case of aperiodic and asymmetric MQW structure. The MQWs are aperiodic with varying well and barrier widths and asymmetric i.e., having different materials and effective masses for the different regions of the wells and barriers. Adjacent wells are coupled through the barriers. Effect of barrier width on the tunneling properties has also been investigated. The theoretical results are compared with experimental results of Giorgetta et all [1]. Results of the computation based on the general model agree well with experimental data.","PeriodicalId":149384,"journal":{"name":"2009 International Conference on Emerging Trends in Electronic and Photonic Devices & Systems","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123790420","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-12-01DOI: 10.1109/ELECTRO.2009.5441129
R.K. Singh, Richa, Amit Katiyar
The over sampled output of a sigma delta modulator is decimated to Nyquist sampling rate by Decimation filters. The decimation filters work two fold, they decimate the sampling rate by a factor of OSR[over sampling rate] in doing so they remove the outband quantization noise resulting in an increase in resolution The speed, area and power consumption of oversampled converter are governed largely by decimation filters in sigma-delta A/D converters. The paper presents a design and implementation of a sigma-delta digital decimation filter. The decimation filter structure is based on cascaded-integrated Comb(CIC) filter[1]. A second decimation filter using CIC for large rate change and cascaded FIR filters, for small rate changes, to improve the frequency response. The proposed structure is even more hardware efficient.
通过抽取滤波器将δ调制器的过采样输出抽取到奈奎斯特采样率。抽取滤波器工作两倍，它们通过OSR[过采样率]因素抽取采样率，这样做可以消除带外量化噪声，从而提高分辨率。过采样转换器的速度，面积和功耗主要由sigma-delta a /D转换器中的抽取滤波器控制。本文介绍了一种sigma-delta数字抽取滤波器的设计与实现。抽取滤波器结构基于级联集成梳状(CIC)滤波器[1]。第二个抽取滤波器使用CIC用于大的速率变化和级联FIR滤波器，用于小的速率变化，以改善频率响应。该结构的硬件效率更高。
{"title":"Design and implementation of CIC based decimation filter for improved frequency response","authors":"R.K. Singh, Richa, Amit Katiyar","doi":"10.1109/ELECTRO.2009.5441129","DOIUrl":"https://doi.org/10.1109/ELECTRO.2009.5441129","url":null,"abstract":"The over sampled output of a sigma delta modulator is decimated to Nyquist sampling rate by Decimation filters. The decimation filters work two fold, they decimate the sampling rate by a factor of OSR[over sampling rate] in doing so they remove the outband quantization noise resulting in an increase in resolution The speed, area and power consumption of oversampled converter are governed largely by decimation filters in sigma-delta A/D converters. The paper presents a design and implementation of a sigma-delta digital decimation filter. The decimation filter structure is based on cascaded-integrated Comb(CIC) filter[1]. A second decimation filter using CIC for large rate change and cascaded FIR filters, for small rate changes, to improve the frequency response. The proposed structure is even more hardware efficient.","PeriodicalId":149384,"journal":{"name":"2009 International Conference on Emerging Trends in Electronic and Photonic Devices & Systems","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114926050","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-12-01DOI: 10.1109/ELECTRO.2009.5441086
Pramod Kumar, Rashid Mahmood, J. Kishor, A. Shrivastav
In this paper we proposed compact size microstrip filter using hexagonal with transmetal Defect Ground Structure (DGS). Here, we have studied the response of five different types (square, circular, triangular, hexagonal & hexagonal with transmetal) of dumbbell shape DGS having same resonant frequency, and compare the response of different shapes DGS. It is observed that proposed DGS have more sharp cutoff frequency, quality factor as well as sharpness factor and occupying area of the proposed DGS is less as compare to other.
{"title":"Control of band stop responses of very compact size microstrip filter of improved Q factor & sharp transition by using hexagonal transmetal DGS","authors":"Pramod Kumar, Rashid Mahmood, J. Kishor, A. Shrivastav","doi":"10.1109/ELECTRO.2009.5441086","DOIUrl":"https://doi.org/10.1109/ELECTRO.2009.5441086","url":null,"abstract":"In this paper we proposed compact size microstrip filter using hexagonal with transmetal Defect Ground Structure (DGS). Here, we have studied the response of five different types (square, circular, triangular, hexagonal & hexagonal with transmetal) of dumbbell shape DGS having same resonant frequency, and compare the response of different shapes DGS. It is observed that proposed DGS have more sharp cutoff frequency, quality factor as well as sharpness factor and occupying area of the proposed DGS is less as compare to other.","PeriodicalId":149384,"journal":{"name":"2009 International Conference on Emerging Trends in Electronic and Photonic Devices & Systems","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116053277","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-12-01DOI: 10.1109/ELECTRO.2009.5441105
M. Verma, S. Verma, D. Dhubkarya
In this paper, the analysis and designing of E-shape microstrip patch antenna for the wireless communication system presented. The shape will provide the broad bandwidth which is required for the operation of fourth generation wireless communication systems. The operating frequency of antenna is 3GHz, the dielectric constant 4.2 and thickness of the antenna is 1.6mm. The comparison between E-shape and T-shape simulation results at operating frequency 3GHz of antenna are done by the help of IE3D Zeland Software (Version 12.0). For the analysis of antenna we used the popular Finite difference time domain method (FDTD). This antenna is fed by a co-axial probe feeding. In this paper, the effects of different types of antenna parameters like return loss, voltage standing wave ratio (VSWR) are also studied.
{"title":"Analysis and designing of E-shape microstrip patch antenna for the wireless communication systems","authors":"M. Verma, S. Verma, D. Dhubkarya","doi":"10.1109/ELECTRO.2009.5441105","DOIUrl":"https://doi.org/10.1109/ELECTRO.2009.5441105","url":null,"abstract":"In this paper, the analysis and designing of E-shape microstrip patch antenna for the wireless communication system presented. The shape will provide the broad bandwidth which is required for the operation of fourth generation wireless communication systems. The operating frequency of antenna is 3GHz, the dielectric constant 4.2 and thickness of the antenna is 1.6mm. The comparison between E-shape and T-shape simulation results at operating frequency 3GHz of antenna are done by the help of IE3D Zeland Software (Version 12.0). For the analysis of antenna we used the popular Finite difference time domain method (FDTD). This antenna is fed by a co-axial probe feeding. In this paper, the effects of different types of antenna parameters like return loss, voltage standing wave ratio (VSWR) are also studied.","PeriodicalId":149384,"journal":{"name":"2009 International Conference on Emerging Trends in Electronic and Photonic Devices & Systems","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124712479","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-12-01DOI: 10.1109/ELECTRO.2009.5441116
S. Pal, T. Bhattacharjee, S. K. Saha
In conventional X-ray mammography, the presences of a small lesion/tumor at the early stage of cancer are not definitely detected because of the complex anatomy of the breast tissues. On the other hand, the low resolution image produced by conventional scinti-mammography does not differentiate between very small benign and malignant tissues. Successful development of Mammary gland Specific Gamma Imaging System (MSGIS), a kind of gamma camera system, may lead to the early detection of breast cancer. A low cost such a camera system is being developed using electron multiplying CCD (EMCCD) as the detector.
{"title":"Design of a mammary gland specific gamma imaging system (MSGIS)","authors":"S. Pal, T. Bhattacharjee, S. K. Saha","doi":"10.1109/ELECTRO.2009.5441116","DOIUrl":"https://doi.org/10.1109/ELECTRO.2009.5441116","url":null,"abstract":"In conventional X-ray mammography, the presences of a small lesion/tumor at the early stage of cancer are not definitely detected because of the complex anatomy of the breast tissues. On the other hand, the low resolution image produced by conventional scinti-mammography does not differentiate between very small benign and malignant tissues. Successful development of Mammary gland Specific Gamma Imaging System (MSGIS), a kind of gamma camera system, may lead to the early detection of breast cancer. A low cost such a camera system is being developed using electron multiplying CCD (EMCCD) as the detector.","PeriodicalId":149384,"journal":{"name":"2009 International Conference on Emerging Trends in Electronic and Photonic Devices & Systems","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123398177","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-12-01DOI: 10.1109/ELECTRO.2009.5441132
K. L. Baishnab, A. Nag, F. Talukdar
This paper explains the different timing attacks on AES and possible approaches/ precautions which can be taken to avoid or minimize the danger of these attacks. The nature and cause of possibilities of attack on AES are mentioned along with the basic model of the attack which was performed to show the weakness of the cipher even after large claims of its non-existence from Authorities and its creators.
{"title":"Notice of Violation of IEEE Publication PrinciplesCache-timing attacks on AES and remedies","authors":"K. L. Baishnab, A. Nag, F. Talukdar","doi":"10.1109/ELECTRO.2009.5441132","DOIUrl":"https://doi.org/10.1109/ELECTRO.2009.5441132","url":null,"abstract":"This paper explains the different timing attacks on AES and possible approaches/ precautions which can be taken to avoid or minimize the danger of these attacks. The nature and cause of possibilities of attack on AES are mentioned along with the basic model of the attack which was performed to show the weakness of the cipher even after large claims of its non-existence from Authorities and its creators.","PeriodicalId":149384,"journal":{"name":"2009 International Conference on Emerging Trends in Electronic and Photonic Devices & Systems","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121287869","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-12-01DOI: 10.1109/ELECTRO.2009.5441186
R. Epstein
Thermal management, which is usually regarded as the domain of mechanical engineering, actually offers exciting opportunities for photonics and electronics. This talk will describe research at Los Alamos National Laboratory and at the University of New Mexico on optical refrigeration and on thin-film electrocaloric heat engines. In optical refrigeration, the goal is to cool solids, typically rare-earth doped glasses and crystals or direct-band-gap semiconductors, to cryogenic temperatures by anti-Stokes luminescence. The best result so far is the cooling of a Yb:YLF crystal to 155 K from room temperature. Thin-film heat engines use a layer of electrocaloric material sandwiched between two thin-film heat switches to provide near-room-temperature cooling or to extract electrical power from heat flows. With heat switches based on liquid crystals, thin-film heat engines should be competitive with thermoelectric devices. With more effective heat switches, thin-film heat engines may rival vapor compression devices.
{"title":"Photonic and electronic cooling","authors":"R. Epstein","doi":"10.1109/ELECTRO.2009.5441186","DOIUrl":"https://doi.org/10.1109/ELECTRO.2009.5441186","url":null,"abstract":"Thermal management, which is usually regarded as the domain of mechanical engineering, actually offers exciting opportunities for photonics and electronics. This talk will describe research at Los Alamos National Laboratory and at the University of New Mexico on optical refrigeration and on thin-film electrocaloric heat engines. In optical refrigeration, the goal is to cool solids, typically rare-earth doped glasses and crystals or direct-band-gap semiconductors, to cryogenic temperatures by anti-Stokes luminescence. The best result so far is the cooling of a Yb:YLF crystal to 155 K from room temperature. Thin-film heat engines use a layer of electrocaloric material sandwiched between two thin-film heat switches to provide near-room-temperature cooling or to extract electrical power from heat flows. With heat switches based on liquid crystals, thin-film heat engines should be competitive with thermoelectric devices. With more effective heat switches, thin-film heat engines may rival vapor compression devices.","PeriodicalId":149384,"journal":{"name":"2009 International Conference on Emerging Trends in Electronic and Photonic Devices & Systems","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124226490","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-12-01DOI: 10.1109/ELECTRO.2009.5441168
Vishal, Ammar, R. Chauhan
Silicon-Germanium Heterojunction Bipolar Transistor (SiGe HBTs) represents the first practical bandgap-engineered Silicon-based transistor. The design issues related to SiGe HBT that makes it suitable for high speed application has been explored. Emphasis has been given to the requirement of low base resistance for achieving a reasonable value of gain at a high frequency. Compared to Silicon bipolar transistors much higher values of gain are obtained for such HBTs.
{"title":"Performance analysis of a bandgap engineered Silicon bipolar transistor","authors":"Vishal, Ammar, R. Chauhan","doi":"10.1109/ELECTRO.2009.5441168","DOIUrl":"https://doi.org/10.1109/ELECTRO.2009.5441168","url":null,"abstract":"Silicon-Germanium Heterojunction Bipolar Transistor (SiGe HBTs) represents the first practical bandgap-engineered Silicon-based transistor. The design issues related to SiGe HBT that makes it suitable for high speed application has been explored. Emphasis has been given to the requirement of low base resistance for achieving a reasonable value of gain at a high frequency. Compared to Silicon bipolar transistors much higher values of gain are obtained for such HBTs.","PeriodicalId":149384,"journal":{"name":"2009 International Conference on Emerging Trends in Electronic and Photonic Devices & Systems","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121733627","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-12-01DOI: 10.1109/ELECTRO.2009.5441138
Amod P. Rale, D. Gharpure, V. Ravindran
X-ray imaging is extensively used in the NDT. In the conventional method, interpretation of the large number of radiographs for defect detection and evaluation is carried out manually by operator or expert, which makes the system subjective. Also interpretation of large number of images is tedious and may lead to misinterpretation. Automation of Non-Destructive evaluation techniques is gaining greater relevance but automatic analysis of X-Ray images is still a complex problem, as the images are noisy, low contrast with a number of artifacts. ANN's are systems which can be trained to analyze input data based on conditions provided to derive required output. This makes the system automatic reducing the subjective interference in analysis of data. Artificial neural network based systems are thus a feasible solution to this problem of X-Ray NDT. Due to complex nature of input images and noise present, Noise removal becomes a problem in X-Ray images. Preprocessing techniques based on statistical analysis have shown improvement in image noise reduction. Pixels/group of pixels, which deviate from the general structural pattern and grey scale distribution are located. The statistically processed pixel values are used to obtain the features vector from defective as well as from non-defective areas. Software for pre-processing and analyzing NDT images has been developed. Software allows user to train neural networks for defect detection. Once trained satisfactorily, the software scans the new input image and uses the trained ANN for defect detection. The final image with defect regions marked will be displayed. This system can be used to obtain the probable defective areas in a given input image. This paper presents performance of MLP and RBF for detection of defect. The effect of different types of input viz. template and moments on performance of ANN is discussed.
{"title":"Comparison of different ANN techniques for automatic defect detection in X-Ray images","authors":"Amod P. Rale, D. Gharpure, V. Ravindran","doi":"10.1109/ELECTRO.2009.5441138","DOIUrl":"https://doi.org/10.1109/ELECTRO.2009.5441138","url":null,"abstract":"X-ray imaging is extensively used in the NDT. In the conventional method, interpretation of the large number of radiographs for defect detection and evaluation is carried out manually by operator or expert, which makes the system subjective. Also interpretation of large number of images is tedious and may lead to misinterpretation. Automation of Non-Destructive evaluation techniques is gaining greater relevance but automatic analysis of X-Ray images is still a complex problem, as the images are noisy, low contrast with a number of artifacts. ANN's are systems which can be trained to analyze input data based on conditions provided to derive required output. This makes the system automatic reducing the subjective interference in analysis of data. Artificial neural network based systems are thus a feasible solution to this problem of X-Ray NDT. Due to complex nature of input images and noise present, Noise removal becomes a problem in X-Ray images. Preprocessing techniques based on statistical analysis have shown improvement in image noise reduction. Pixels/group of pixels, which deviate from the general structural pattern and grey scale distribution are located. The statistically processed pixel values are used to obtain the features vector from defective as well as from non-defective areas. Software for pre-processing and analyzing NDT images has been developed. Software allows user to train neural networks for defect detection. Once trained satisfactorily, the software scans the new input image and uses the trained ANN for defect detection. The final image with defect regions marked will be displayed. This system can be used to obtain the probable defective areas in a given input image. This paper presents performance of MLP and RBF for detection of defect. The effect of different types of input viz. template and moments on performance of ANN is discussed.","PeriodicalId":149384,"journal":{"name":"2009 International Conference on Emerging Trends in Electronic and Photonic Devices & Systems","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134339763","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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