高击穿电压AlGaN/GaN hemt的开关特性

Y. Dora, C. Suh, A. Chakraborty, S. Heikman, S. Chandrasekaran, V. Mehrotraa, U. Mishra
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引用次数: 6

摘要

在本报告中,我们介绍了在多个场极板的帮助下实现高击穿电压的大面积AlGaN/GaN HEMT器件的开关测量。AlGaN/GaN高电子迁移率晶体管在大功率开关方面比硅基和碳化硅基晶体管具有潜在的优势。在AlGaN/GaN HEMT体系中,高电子迁移率与高密度极化诱导的二维电子浓度相结合,产生了非常低的导通电阻和高开关频率。同时,AlGaN/GaN体系的高带隙能量导致了高临界电场。因此,能够在高频率(~100MHz)下工作的高压电源开关是可能的。然而,在高频工作中存在一些困难,阻碍了高击穿电压的实现
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Switching characteristics of high-breakdown voltage AlGaN/GaN HEMTs
In this report we present the switching measurements on large area AlGaN/GaN HEMT devices with high breakdown voltage achieved with the help of multiple field plates. AlGaN/GaN high electron mobility transistors have shown potential advantages over Si and SiC based transistors for high power switching. The very high electron mobility in the AlGaN/GaN HEMT system combined with the high density of polarization induced 2D electron concentration yield a very low on-resistance and high switching frequency. Also the high band gap energy of AlGaN/GaN system results in a high critical electric field. Hence it is possible to have high voltage power switches capable of operating at high frequencies (~100MHz). However there are some difficulties, which have prevented the achievement of very high breakdown voltages at high frequency operation
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