{"title":"soc的制造测试","authors":"R. Kapur, T. Williams","doi":"10.1109/ATS.2002.1181730","DOIUrl":null,"url":null,"abstract":"In this paper the solution the industry is driving towards for manufacturing test of SoCs is described. The quality of test for every core that is integrated on the chip is very important to the overall quality of the SoC. In this paper a method for evaluating the quality needs of an embedded core relative to the embedded environment is presented. Due to the partitioning of the test data and the increased stress in quality for individual designs the test application time is increasing. This paper presents the problems associated with test application time with SoCs.","PeriodicalId":199542,"journal":{"name":"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Manufacturing test of SoCs\",\"authors\":\"R. Kapur, T. Williams\",\"doi\":\"10.1109/ATS.2002.1181730\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper the solution the industry is driving towards for manufacturing test of SoCs is described. The quality of test for every core that is integrated on the chip is very important to the overall quality of the SoC. In this paper a method for evaluating the quality needs of an embedded core relative to the embedded environment is presented. Due to the partitioning of the test data and the increased stress in quality for individual designs the test application time is increasing. This paper presents the problems associated with test application time with SoCs.\",\"PeriodicalId\":199542,\"journal\":{\"name\":\"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-11-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.2002.1181730\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2002.1181730","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In this paper the solution the industry is driving towards for manufacturing test of SoCs is described. The quality of test for every core that is integrated on the chip is very important to the overall quality of the SoC. In this paper a method for evaluating the quality needs of an embedded core relative to the embedded environment is presented. Due to the partitioning of the test data and the increased stress in quality for individual designs the test application time is increasing. This paper presents the problems associated with test application time with SoCs.
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