{"title":"用傅立叶级数分析碳纳米管互连的紧凑模型","authors":"S. Subash, Md. Sajjad Rahaman, M. Chowdhury","doi":"10.1109/MWSCAS.2009.5235944","DOIUrl":null,"url":null,"abstract":"In current literature various equivalent circuit models and reduction techniques have been demonstrated to study the behavior and performance of carbon nano tubes (CNTs). However, most of these methods are very complex and predominantly use SPICE/HSPICE simulations resulting in high computational time. This paper presents a compact modeling approach for CNT interconnects. Results both in the time domain and frequency domain are provided using a Fourier series approach for the analysis of CNT interconnects. The results obtained are compared against other conventional methods. The percentage error in delay for both single walled CNT (SWCNT) and multi-walled CNT (MWCNT) interconnects is found to be less than 5% and the percentage error in overshoot estimation for both types of CNTs is also under 8%.","PeriodicalId":254577,"journal":{"name":"2009 52nd IEEE International Midwest Symposium on Circuits and Systems","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Compact model for carbon nanotubes interconnects using fourier series analysis\",\"authors\":\"S. Subash, Md. Sajjad Rahaman, M. Chowdhury\",\"doi\":\"10.1109/MWSCAS.2009.5235944\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In current literature various equivalent circuit models and reduction techniques have been demonstrated to study the behavior and performance of carbon nano tubes (CNTs). However, most of these methods are very complex and predominantly use SPICE/HSPICE simulations resulting in high computational time. This paper presents a compact modeling approach for CNT interconnects. Results both in the time domain and frequency domain are provided using a Fourier series approach for the analysis of CNT interconnects. The results obtained are compared against other conventional methods. The percentage error in delay for both single walled CNT (SWCNT) and multi-walled CNT (MWCNT) interconnects is found to be less than 5% and the percentage error in overshoot estimation for both types of CNTs is also under 8%.\",\"PeriodicalId\":254577,\"journal\":{\"name\":\"2009 52nd IEEE International Midwest Symposium on Circuits and Systems\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-09-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 52nd IEEE International Midwest Symposium on Circuits and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSCAS.2009.5235944\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 52nd IEEE International Midwest Symposium on Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSCAS.2009.5235944","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Compact model for carbon nanotubes interconnects using fourier series analysis
In current literature various equivalent circuit models and reduction techniques have been demonstrated to study the behavior and performance of carbon nano tubes (CNTs). However, most of these methods are very complex and predominantly use SPICE/HSPICE simulations resulting in high computational time. This paper presents a compact modeling approach for CNT interconnects. Results both in the time domain and frequency domain are provided using a Fourier series approach for the analysis of CNT interconnects. The results obtained are compared against other conventional methods. The percentage error in delay for both single walled CNT (SWCNT) and multi-walled CNT (MWCNT) interconnects is found to be less than 5% and the percentage error in overshoot estimation for both types of CNTs is also under 8%.