{"title":"近场扫描微波显微镜对少层石墨烯的高分辨率成像","authors":"T. Monti, A. di Donato, M. Farina","doi":"10.1109/SIRF.2012.6160156","DOIUrl":null,"url":null,"abstract":"In this work, we describe the application of an in-house system performing simultaneously Scanning Tunneling Microscopy (STM) and wide-band Near Field Scanning Microwave Microscopy (wide-band SMM) to a few-layer graphene sample. This sample is produced by mechanical exfoliation of bulk highly oriented graphite and deposited on a substrate of conductive glass. By introducing the time-domain conversion of frequency domain data, we show that it is possible to achieve nanometric resolution.","PeriodicalId":339730,"journal":{"name":"2012 IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"High resolution imaging of few-layer graphene by Near-Field Scanning Microwave Microscopy\",\"authors\":\"T. Monti, A. di Donato, M. Farina\",\"doi\":\"10.1109/SIRF.2012.6160156\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, we describe the application of an in-house system performing simultaneously Scanning Tunneling Microscopy (STM) and wide-band Near Field Scanning Microwave Microscopy (wide-band SMM) to a few-layer graphene sample. This sample is produced by mechanical exfoliation of bulk highly oriented graphite and deposited on a substrate of conductive glass. By introducing the time-domain conversion of frequency domain data, we show that it is possible to achieve nanometric resolution.\",\"PeriodicalId\":339730,\"journal\":{\"name\":\"2012 IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SIRF.2012.6160156\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SIRF.2012.6160156","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
High resolution imaging of few-layer graphene by Near-Field Scanning Microwave Microscopy
In this work, we describe the application of an in-house system performing simultaneously Scanning Tunneling Microscopy (STM) and wide-band Near Field Scanning Microwave Microscopy (wide-band SMM) to a few-layer graphene sample. This sample is produced by mechanical exfoliation of bulk highly oriented graphite and deposited on a substrate of conductive glass. By introducing the time-domain conversion of frequency domain data, we show that it is possible to achieve nanometric resolution.
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