{"title":"VLSI电路中的延迟和功率优化","authors":"L. Glasser, L. Hoyte","doi":"10.1109/DAC.1984.1585848","DOIUrl":null,"url":null,"abstract":"The problem of optimally sizing the transistors in a digital MOS VLSI circuit is examined. Macro-models are developed and new theorems on the optimal sizing of the transistors in a critical path are presented. The results of a design automation procedure to perform the optimization is discussed.","PeriodicalId":188431,"journal":{"name":"21st Design Automation Conference Proceedings","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1984-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"80","resultStr":"{\"title\":\"Delay and Power Optimization in VLSI Circuits\",\"authors\":\"L. Glasser, L. Hoyte\",\"doi\":\"10.1109/DAC.1984.1585848\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The problem of optimally sizing the transistors in a digital MOS VLSI circuit is examined. Macro-models are developed and new theorems on the optimal sizing of the transistors in a critical path are presented. The results of a design automation procedure to perform the optimization is discussed.\",\"PeriodicalId\":188431,\"journal\":{\"name\":\"21st Design Automation Conference Proceedings\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1984-06-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"80\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"21st Design Automation Conference Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DAC.1984.1585848\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"21st Design Automation Conference Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DAC.1984.1585848","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The problem of optimally sizing the transistors in a digital MOS VLSI circuit is examined. Macro-models are developed and new theorems on the optimal sizing of the transistors in a critical path are presented. The results of a design automation procedure to perform the optimization is discussed.