{"title":"具有一个优势阱能级的太阳能电池载流子寿命的温度研究","authors":"D. Dobrescu, A. Rusu","doi":"10.1109/SMICND.1996.557465","DOIUrl":null,"url":null,"abstract":"Based on experimental observation, a new mathematical model is made for explaining the carrier lifetime versus temperature dependence in silicon solar cells manufactured on p-type material with one dominant acceptor trap energy level, situated in the lower part of the forbidden band. This model explains the behaviour of the lifetime taking into account the SRH model for the lifetime and the physical parameters temperature dependencies.","PeriodicalId":266178,"journal":{"name":"1996 International Semiconductor Conference. 19th Edition. CAS'96 Proceedings","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Temperature study of the carrier lifetime in solar cells with one dominant trap energy level\",\"authors\":\"D. Dobrescu, A. Rusu\",\"doi\":\"10.1109/SMICND.1996.557465\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Based on experimental observation, a new mathematical model is made for explaining the carrier lifetime versus temperature dependence in silicon solar cells manufactured on p-type material with one dominant acceptor trap energy level, situated in the lower part of the forbidden band. This model explains the behaviour of the lifetime taking into account the SRH model for the lifetime and the physical parameters temperature dependencies.\",\"PeriodicalId\":266178,\"journal\":{\"name\":\"1996 International Semiconductor Conference. 19th Edition. CAS'96 Proceedings\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-10-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1996 International Semiconductor Conference. 19th Edition. CAS'96 Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMICND.1996.557465\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 International Semiconductor Conference. 19th Edition. CAS'96 Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.1996.557465","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Temperature study of the carrier lifetime in solar cells with one dominant trap energy level
Based on experimental observation, a new mathematical model is made for explaining the carrier lifetime versus temperature dependence in silicon solar cells manufactured on p-type material with one dominant acceptor trap energy level, situated in the lower part of the forbidden band. This model explains the behaviour of the lifetime taking into account the SRH model for the lifetime and the physical parameters temperature dependencies.