面向控制流密集设计的可靠性感知寄存器绑定

Liang Chen, M. Tahoori
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引用次数: 8

摘要

由于软误差是纳米级超大规模集成电路的主要可靠性问题,在高层次合成过程中解决软误差会对整体设计质量产生重大影响。基于对行为设计,特别是控制流密集型设计中变量存在不均匀软错误漏洞的观察,我们提出了一种新的可靠性感知寄存器绑定技术,以探索在高级综合中更有效地降低软错误。首先,通过考虑控制流和数据流中的错误传播和掩蔽,我们在行为层面进行了全面的变量漏洞分析。然后采用基于整数线性规划的优化方法,采用选择性寄存器保护方案,将漏洞纳入寄存器绑定阶段。实验结果表明,该技术可以在很小一部分(20%)寄存器保护的情况下实现显著的软错误缓解(占总漏洞的60%)。
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Reliability-aware register binding for control-flow intensive designs
As soft error is a major reliability issue for nanoscale VLSI, addressing it during high level synthesis can have a significant impact on the overall design quality. Motivated by the observation that for behavioral designs, especially control-flow intensive ones, variables have nonuniform soft error vulnerabilities, we propose a novel reliability-aware register binding technique to explore more effective soft error mitigation during high level synthesis. We first perform a comprehensive variable vulnerability analysis at the behavioral level, by considering error propagation and masking in both control and data flow. Then an optimization based on integer linear programming is used to incorporate vulnerabilities into the register binding phase with a selective register protection scheme. The experimental results reveal that the proposed technique can achieve significant soft error mitigation (60% coverage of the total vulnerabilities) with a small portion (20%) of register protection.
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